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Preventing Contamination-Caused Assembly Failure
Contamination "favors" moisture absorption, and with it comes electrochemical migration and corrosion-induced leakage currents. Studies indicate a higher malfunctioning rate among some Pb-free alloys because of the presence of dendrites, particularly "edge-triggered" circuits. Mo...
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Published in: | Circuits Assembly 2009-06, Vol.20 (6), p.42 |
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Main Author: | |
Format: | Magazinearticle |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | Contamination "favors" moisture absorption, and with it comes electrochemical migration and corrosion-induced leakage currents. Studies indicate a higher malfunctioning rate among some Pb-free alloys because of the presence of dendrites, particularly "edge-triggered" circuits. Moreover, the intrinsic conductivity and electrodiffusion effect of most contamination lowers the surface resistance. |
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ISSN: | 1054-0407 |