Loading…
Measuring and Controlling Wave Height and Dwell Time
The system uses eddy current technology that has a high degree of immunity to the hostile operating environment near the solder wave. Measurement of the solder wave's intrusion into the sensor's magnetic field is converted to a voltage proportional to the distance between the sensor and so...
Saved in:
Published in: | Circuits Assembly 2008-06, Vol.19 (6), p.30 |
---|---|
Main Author: | |
Format: | Magazinearticle |
Language: | English |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | |
container_issue | 6 |
container_start_page | 30 |
container_title | Circuits Assembly |
container_volume | 19 |
creator | Kirby, Ken |
description | The system uses eddy current technology that has a high degree of immunity to the hostile operating environment near the solder wave. Measurement of the solder wave's intrusion into the sensor's magnetic field is converted to a voltage proportional to the distance between the sensor and solder wave. This voltage is interpreted by software and converted to a reading that represents the solder wave surface in relation to a PCB supported by the conveyor fingers. |
format | magazinearticle |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_reports_216083779</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1501548171</sourcerecordid><originalsourceid>FETCH-LOGICAL-p96t-474d520ff65c628d8324d80f8a3aa2e0a4c0e30d9ce1a0e19be16ad556b849943</originalsourceid><addsrcrecordid>eNotjMtOwzAQAH0AiVL4h_ABkdb22rGPKDyK1IpLJI7VNt6UIJME24XfRzxOo9FIcyZWEgzWgNBciMuc3wCkRmlWAndM-ZTG6VjRFKp2nkqaY_zxF_rkasPj8bX8trsvjrHqxne-EucDxczX_1yL7uG-azf19vnxqb3d1ou3pcYGg1EwDNb0VrngtMLgYHCkiRQDYQ-sIfieJQFLf2BpKRhjDw69R70WN3_bJc0fJ85ln3iZU8l7JS043TRefwNGXj5k</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>magazinearticle</recordtype><pqid>216083779</pqid></control><display><type>magazinearticle</type><title>Measuring and Controlling Wave Height and Dwell Time</title><source>Business Source Ultimate</source><creator>Kirby, Ken</creator><creatorcontrib>Kirby, Ken</creatorcontrib><description>The system uses eddy current technology that has a high degree of immunity to the hostile operating environment near the solder wave. Measurement of the solder wave's intrusion into the sensor's magnetic field is converted to a voltage proportional to the distance between the sensor and solder wave. This voltage is interpreted by software and converted to a reading that represents the solder wave surface in relation to a PCB supported by the conveyor fingers.</description><identifier>ISSN: 1054-0407</identifier><language>eng</language><publisher>San Francisco: Printed Circuit Engineering Association, Inc</publisher><subject>Control systems ; Defects ; Design of experiments ; PCB ; Polychlorinated biphenyls ; Process engineering ; Recipes ; Sensors ; Shipwrecks ; Software ; Soldering ; Waveform analysis</subject><ispartof>Circuits Assembly, 2008-06, Vol.19 (6), p.30</ispartof><rights>Copyright UP Media Group, Inc. Jun 2008</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>312,780,784,791</link.rule.ids></links><search><creatorcontrib>Kirby, Ken</creatorcontrib><title>Measuring and Controlling Wave Height and Dwell Time</title><title>Circuits Assembly</title><description>The system uses eddy current technology that has a high degree of immunity to the hostile operating environment near the solder wave. Measurement of the solder wave's intrusion into the sensor's magnetic field is converted to a voltage proportional to the distance between the sensor and solder wave. This voltage is interpreted by software and converted to a reading that represents the solder wave surface in relation to a PCB supported by the conveyor fingers.</description><subject>Control systems</subject><subject>Defects</subject><subject>Design of experiments</subject><subject>PCB</subject><subject>Polychlorinated biphenyls</subject><subject>Process engineering</subject><subject>Recipes</subject><subject>Sensors</subject><subject>Shipwrecks</subject><subject>Software</subject><subject>Soldering</subject><subject>Waveform analysis</subject><issn>1054-0407</issn><fulltext>true</fulltext><rsrctype>magazinearticle</rsrctype><creationdate>2008</creationdate><recordtype>magazinearticle</recordtype><recordid>eNotjMtOwzAQAH0AiVL4h_ABkdb22rGPKDyK1IpLJI7VNt6UIJME24XfRzxOo9FIcyZWEgzWgNBciMuc3wCkRmlWAndM-ZTG6VjRFKp2nkqaY_zxF_rkasPj8bX8trsvjrHqxne-EucDxczX_1yL7uG-azf19vnxqb3d1ou3pcYGg1EwDNb0VrngtMLgYHCkiRQDYQ-sIfieJQFLf2BpKRhjDw69R70WN3_bJc0fJ85ln3iZU8l7JS043TRefwNGXj5k</recordid><startdate>20080601</startdate><enddate>20080601</enddate><creator>Kirby, Ken</creator><general>Printed Circuit Engineering Association, Inc</general><scope>3V.</scope><scope>7RQ</scope><scope>7WY</scope><scope>7XB</scope><scope>883</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8FL</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>L.-</scope><scope>L6V</scope><scope>M0F</scope><scope>M0N</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>U9A</scope></search><sort><creationdate>20080601</creationdate><title>Measuring and Controlling Wave Height and Dwell Time</title><author>Kirby, Ken</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p96t-474d520ff65c628d8324d80f8a3aa2e0a4c0e30d9ce1a0e19be16ad556b849943</frbrgroupid><rsrctype>magazinearticle</rsrctype><prefilter>magazinearticle</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Control systems</topic><topic>Defects</topic><topic>Design of experiments</topic><topic>PCB</topic><topic>Polychlorinated biphenyls</topic><topic>Process engineering</topic><topic>Recipes</topic><topic>Sensors</topic><topic>Shipwrecks</topic><topic>Software</topic><topic>Soldering</topic><topic>Waveform analysis</topic><toplevel>online_resources</toplevel><creatorcontrib>Kirby, Ken</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>Career & Technical Education Database</collection><collection>ABI/INFORM Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Trade & Industry (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer science database</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Collection</collection><collection>Computing Database</collection><collection>Engineering Database</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>One Business (ProQuest)</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering collection</collection><collection>ProQuest Central Basic</collection><jtitle>Circuits Assembly</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kirby, Ken</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measuring and Controlling Wave Height and Dwell Time</atitle><jtitle>Circuits Assembly</jtitle><date>2008-06-01</date><risdate>2008</risdate><volume>19</volume><issue>6</issue><spage>30</spage><pages>30-</pages><issn>1054-0407</issn><abstract>The system uses eddy current technology that has a high degree of immunity to the hostile operating environment near the solder wave. Measurement of the solder wave's intrusion into the sensor's magnetic field is converted to a voltage proportional to the distance between the sensor and solder wave. This voltage is interpreted by software and converted to a reading that represents the solder wave surface in relation to a PCB supported by the conveyor fingers.</abstract><cop>San Francisco</cop><pub>Printed Circuit Engineering Association, Inc</pub></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1054-0407 |
ispartof | Circuits Assembly, 2008-06, Vol.19 (6), p.30 |
issn | 1054-0407 |
language | eng |
recordid | cdi_proquest_reports_216083779 |
source | Business Source Ultimate |
subjects | Control systems Defects Design of experiments PCB Polychlorinated biphenyls Process engineering Recipes Sensors Shipwrecks Software Soldering Waveform analysis |
title | Measuring and Controlling Wave Height and Dwell Time |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T12%3A07%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measuring%20and%20Controlling%20Wave%20Height%20and%20Dwell%20Time&rft.jtitle=Circuits%20Assembly&rft.au=Kirby,%20Ken&rft.date=2008-06-01&rft.volume=19&rft.issue=6&rft.spage=30&rft.pages=30-&rft.issn=1054-0407&rft_id=info:doi/&rft_dat=%3Cproquest%3E1501548171%3C/proquest%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p96t-474d520ff65c628d8324d80f8a3aa2e0a4c0e30d9ce1a0e19be16ad556b849943%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=216083779&rft_id=info:pmid/&rfr_iscdi=true |