Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine

X-ray backlighting and microscopy systems for the 1-10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more effi...

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Published in:Applied optics (2004) 2003-07, Vol.42 (19), p.4059
Main Authors: Sinars, Daniel B, Bennett, Guy R, Wenger, David F, Cuneo, Michael E, Porter, John L
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Language:English
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Bennett, Guy R
Wenger, David F
Cuneo, Michael E
Porter, John L
description X-ray backlighting and microscopy systems for the 1-10-keV range based on spherically or toroidally bent crystals are discussed. These systems are ideal for use on the Sandia Z machine, a megajoule-class x-ray facility. Near-normal-incidence crystal microscopy systems have been shown to be more efficient than pinhole cameras with the same spatial resolution and magnification [Appl. Opt. 37, 1784 (1998)]. We show that high-resolution (< or = 10 microm) x-ray backlighting systems using bent crystals can be more efficient than analogous point-projection imaging systems. Examples of bent-crystal-backlighting results that demonstrate 10-microm resolution over a 20-mm field of view are presented.
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title Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine
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