Exact and Approximate Area-Proportional Circular Venn and Euler Diagrams

Scientists conducting microarray and other experiments use circular Venn and Euler diagrams to analyze and illustrate their results. As one solution to this problem, this paper introduces a statistical model for fitting area-proportional Venn and Euler diagrams to observed data. The statistical mode...

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Bibliographic Details
Published in:IEEE transactions on visualization and computer graphics 2012-02, Vol.18 (2), p.321-331
Main Author: Wilkinson, L.
Format: Article
Language:English
Subjects:
Algorithms
Approximation
Approximation methods
bioinformatics
Computational Biology - methods
Computational modeling
Computer Graphics
Data models
Equations
Internet
Layout
Mathematical model
Models, Statistical
Software
statistical graphics
Stress
Visualization
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Summary:Scientists conducting microarray and other experiments use circular Venn and Euler diagrams to analyze and illustrate their results. As one solution to this problem, this paper introduces a statistical model for fitting area-proportional Venn and Euler diagrams to observed data. The statistical model outlined in this paper includes a statistical loss function and a minimization procedure that enables formal estimation of the Venn/Euler area-proportional model for the first time. A significance test of the null hypothesis is computed for the solution. Residuals from the model are available for inspection. As a result, this algorithm can be used for both exploration and inference on real data sets. A Java program implementing this algorithm is available under the Mozilla Public License. An R function venneuler () is available as a package in CRAN and a plugin is available in Cytoscape.
ISSN:1077-2626
1941-0506
DOI:10.1109/TVCG.2011.56