Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is deter...

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Bibliographic Details
Published in:Review of scientific instruments 2016-08, Vol.87 (8), p.086108-086108
Main Authors: Li, Meng, Xu, Chunkai, Zhang, Panke, Li, Zhean, Chen, Xiangjun
Format: Article
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRON BEAMS
ELECTRON EMISSION
Electron energy
ELECTRONS
FIELD EMISSION
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MAPPING
SCANNING TUNNELING MICROSCOPY
Scientific apparatus & instruments
SPATIAL RESOLUTION
SPECTROMETERS
SPECTROSCOPY
Spectrum analysis
SURFACES
TOPOGRAPHY
TUNNEL EFFECT
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Summary:We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4960716