Self-phase modulation in highly confined submicron Ta 2 O 5 channel waveguides

Optical spectra broadening as a result self-phase modulation in a channel waveguide fabricated on a high quality tantalum pentoxide (Ta O ) film by using RF sputtering is measured. The full-width at half maximum of the optical spectra for transverse electric (TE)/transverse magnetic (TM) polarizatio...

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Bibliographic Details
Published in:Optics express 2016-09, Vol.24 (19), p.21633
Main Authors: Lin, Yuan-Yao, Wu, Chung-Lun, Chi, Wen-Chun, Chiu, Yi-Jen, Hung, Yung-Jr, Chu, Ann-Kuo, Lee, Chao-Kuei
Format: Article
Language:English
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Summary:Optical spectra broadening as a result self-phase modulation in a channel waveguide fabricated on a high quality tantalum pentoxide (Ta O ) film by using RF sputtering is measured. The full-width at half maximum of the optical spectra for transverse electric (TE)/transverse magnetic (TM) polarizations of 42.5/31.7 nm is obtained using pulses of 10 nm at a wavelength of 800 nm with a peak-coupled power of 43.77 W. The nonlinear Kerr coefficients of 2.14 × 10 cm /W and 1.92 × 10 cm /W for TE and TM polarizations, respectively, are then extracted from the experiments using a theoretical model based on the method of moments. The obtained results on the nonlinearity further suggest that Ta O is a promising material to develop nonlinear waveguide devices for integrated photonics.
ISSN:1094-4087
DOI:10.1364/OE.24.021633