The offset droplet: a new methodology for studying the solid/water interface using x-ray photoelectron spectroscopy

The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of s...

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Bibliographic Details
Published in:Journal of physics. Condensed matter 2017-11, Vol.29 (45), p.454001-454001
Main Authors: Booth, S G, Tripathi, A M, Strashnov, I, Dryfe, R A W, Walton, A S
Format: Article
Language:English
Subjects:
NAP-XPS
solid/liquid interface
spectroscopy
surface science
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Summary:The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area-continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO2(110) single crystal and demonstrate that the solid/liquid interface is addressable.
ISSN:0953-8984
1361-648X
DOI:10.1088/1361-648X/aa8b92