Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?

• Published in: Structural dynamics (Melville, N.Y.) N.Y.), 2019-07, Vol.6 (4), p.044103-044103
• Main Authors: Östlin, C., Timneanu, N., Caleman, C., Martin, A. V.
• Format: Article
• Language: English
• Subjects: Atoms & subatomic particles; Crystallography; Experiments; Explosions; Free electron lasers; High resolution; Image resolution; Inhomogeneity; Limiting factors; Molecular dynamics; Noise; Proteins; Radiation damage; Shot; X ray imagery; X-rays
• ISSN: 2329-7778; 2329-7778
• DOI: 10.1063/1.5098309

The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnanometer X-ray imaging of single particles and that X-ray pulses need to be as short as possible. Based on the molecular dynamics simulations of proteins in X-ray fields of various durations (5 fs, 25 fs, and 50 fs), we show that the noise in the diffracted signal caused by radiation damage is less than what can be expected from other sources, such as sample inhomogeneity and X-ray shot-to-shot variations. These findings show a different aspect of the feasibility of high-resolution single particle imaging using free-electron lasers, where employing X-ray pulses of longer durations could still provide a useful diffraction signal above the noise due to the Coulomb explosion.