Excited state lifetime modulation in semiconductor nanocrystals for super-resolution imaging

We report on proof of principle measurements of a concept for a super-resolution imaging method that is based on excitation field density-dependent lifetime modulation of semiconductor nanocrystals. The prerequisite of the technique is access to semiconductor nanocrystals with emission lifetimes tha...

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Bibliographic Details
Published in:Nanotechnology 2022-09, Vol.33 (36), p.365201
Main Authors: Ghosh, Subhabrata, Hollingsworth, Jennifer A, Gallea, Jose Ignacio, Majumder, Somak, Enderlein, Jörg, Chizhik, Alexey I
Format: Article
Language:English
Subjects:
FLIM
fluorescence lifetime imaging microscopy
semiconductor nanocrystals
super-resolution imaging
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Summary:We report on proof of principle measurements of a concept for a super-resolution imaging method that is based on excitation field density-dependent lifetime modulation of semiconductor nanocrystals. The prerequisite of the technique is access to semiconductor nanocrystals with emission lifetimes that depend on the excitation intensity. Experimentally, the method requires a confocal microscope with fluorescence-lifetime measurement capability that makes it easily accessible to a broad optical imaging community. We demonstrate with single particle imaging that the method allows one to achieve a spatial resolution of the order of several tens of nanometers at moderate fluorescence excitation intensity.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/ac73a2