Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations

A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of soft 2D monatomic she...

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Bibliographic Details
Published in:Nanotechnology 2023-04, Vol.34 (15), p.15
Main Authors: Sarkar, N, Bandaru, P R, Dynes, R C
Format: Article
Language:English
Subjects:
atomic deformation
moiré pattern
scanning tunneling microscopy
van der Waals
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Summary:A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of soft 2D monatomic sheets of graphene and graphite in contrast to NbSe indicates related association with the underlying local bonding configurations. Surface deformation of 2D graphitic moiré patterns reveal the inter-layer van der Waals strength varying across its domains. These results help in the understanding of the comparable interlayer bonding strength of 1D grain boundary as well as the grains. Anomalous phenomena related to probing 2D materials at small gap distances as a function of strain is discussed.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/acb442