Degradation phenomena of quantum dot light-emitting diodes induced by high electric field

• Published in: Nanotechnology 2023-06, Vol.34 (26), p.265705
• Main Authors: Cha, Yunmi, Woo, Hwi Je, Yoon, Sang Hyun, Song, Young Jae, Choi, Young Jin, Kim, Seong Heon
• Format: Article
• Language: English
• Subjects: degradation; metal ion migration; QLED; quantum dot light emitting diode
• ISSN: 0957-4484; 1361-6528
• DOI: 10.1088/1361-6528/acc871

Quantum dots possess exceptional optoelectronic properties, such as narrow bandwidth, controllable wavelength, and compatibility with solution-based processing. However, for efficient and stable operation in electroluminescence mode, several issues require resolution. Particularly, as device dimensions decrease, a higher electric field may be applied through next-generation quantum dot light-emitting diode (QLED) devices, which could further degrade the device. In this study, we conduct a systematic analysis of the degradation phenomena of a QLED device induced by a high electric field, using scanning probe microscopy (SPM) and transmission electron microscopy (TEM). We apply a local high electric field to the surface of a QLED device using an atomic force microscopy (AFM) tip, and we investigate changes in morphology and work function in the Kelvin probe force microscopy mode. After the SPM experiments, we perform TEM measurements on the same degraded sample area affected by the electric field of the AFM tip. The results indicate that a QLED device could be mechanically degraded by a high electric field, and work function changes significantly in degraded areas. In addition, the TEM measurements reveal that In ions migrate from the indium tin oxide (ITO) bottom electrode to the top of the QLED device. The ITO bottom electrode also deforms significantly, which could induce work function variation. The systematic approach adopted in this study can provide a suitable methodology for investigating the degradation phenomena of various optoelectronic devices.