Microstructural characterization and inductively coupled plasma-reactive ion etching resistance of Y 2 O 3 -Y 4 Al 2 O 9 composite under CF 4 /Ar/O 2 mixed gas conditions

• Published in: Scientific reports 2024-03, Vol.14 (1), p.7008
• Main Authors: Ma, Ho Jin, Kim, Seonghyeon, Kim, Ha-Neul, Kim, Mi-Ju, Ko, Jae-Woong, Lee, Jae-Wook, Kim, Jung-Hyung, Lee, Hyo-Chang, Park, Young-Jo
• Format: Article
• Language: English
• ISSN: 2045-2322

In the semiconductor manufacturing process, when conducting inductively coupled plasma-reactive ion etching in challenging environments, both wafers and the ceramic components comprising the chamber's interior can be influenced by plasma attack. When ceramic components are exposed to long-term plasma environments, the eroded components must be replaced. Furthermore, non-volatile reactants can form and settle on semiconductor chips, acting as contaminants and reducing semiconductor production yield. Therefore, for semiconductor processing equipment parts to be utilized, it is necessary that they exhibit minimized generation of contaminant particles and not deviate significantly from the composition of conventionally used Al O and Y O ; part must also last long in various physicochemical etching environment. Herein, we investigate the plasma etching behavior of Y O -Y Al O (YAM) composites with a variety of mixing ratios under different gas fraction conditions. The investigation revealed that the etching rates and changes in surface roughness for these materials were significantly less than those of Y O materials subjected to both chemical and physical etching. Microstructure analysis was conducted to demonstrate the minimization of crater formation. Mechanical properties of the composite were also analyzed. The results show that the composite can be commercialized as next-generation ceramic component in semiconductor processing equipment applications.