Bending and reverse bending during the fabrication of novel GaAs/(In,Ga)As/GaAs core–shell nanowires monitored by in situ x-ray diffraction

• Published in: Nanotechnology 2024-07, Vol.35 (29), p.295705
• Main Authors: Al Hassan, Ali, AlHumaidi, Mahmoud, Kalt, Jochen, Schneider, Reinhard, Müller, Erich, Anjum, Taseer, Khadiev, Azat, Novikov, Dmitri V, Pietsch, Ullrich, Baumbach, Tilo
• Format: Article
• Language: English
• Subjects: bending and reverse bending; energy dispersive x-ray spectroscopy; molecular beam epitaxy; radial nanowire heterostructures; x-ray diffraction
• ISSN: 0957-4484; 1361-6528
• DOI: 10.1088/1361-6528/ad3fc1

We report on the fabrication of a novel design of GaAs/(In,Ga)As/GaAs radial nanowire heterostructures on a Si 111 substrate, where, for the first time, the growth of inhomogeneous shells on a lattice mismatched core results in straight nanowires instead of bent. Nanowire bending caused by axial tensile strain induced by the (In,Ga)As shell on the GaAs core is reversed by axial compressive strain caused by the GaAs outer shell on the (In,Ga)As shell. Progressive nanowire bending and reverse bending in addition to the axial strain evolution during the two processes are accessed by in situ by X-ray diffraction. The diameter of the core, thicknesses of the shells, as well as the indium concentration and distribution within the (In,Ga)As quantum well are revealed by 2D energy dispersive X-ray spectroscopy using a transmission electron microscope. Shell(s) growth on one side of the core without substrate rotation results in planar-like radial heterostructures in the form of free standing straight nanowires.