Micro-CT imaging of multiple K-edge elements using GaAs and CdTe photon counting detectors

To evaluate the performance of two photon-counting (PC) detectors based on different detector materials, gallium arsenide (GaAs) and cadmium telluride (CdTe), for PC micro-CT imaging of phantoms with multiple contrast materials. Another objective is to determine if combining these two detectors in t...

Full description

Saved in:
Bibliographic Details
Published in:Physics in medicine & biology 2023-04, Vol.68 (8), p.85023
Main Authors: Allphin, A J, Clark, D P, Thuering, T, Bhandari, P, Ghaghada, K B, Badea, C T
Format: Article
Language:English
Subjects:
Animals
Bismuth
Cadmium Compounds
constrast agents
Contrast Media
Iodine
Mice
micro-CT
nanoparticles
photon-counting
preclinical
Quantum Dots
spectral
Tellurium
X-Ray Microtomography - methods
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:To evaluate the performance of two photon-counting (PC) detectors based on different detector materials, gallium arsenide (GaAs) and cadmium telluride (CdTe), for PC micro-CT imaging of phantoms with multiple contrast materials. Another objective is to determine if combining these two detectors in the same micro-CT system can offer higher spectral performance and significant artifact reduction compared to a single detector system. . We have constructed a dual-detector, micro-CT system equipped with two PCDs based on different detector materials: gallium arsenide (GaAs) and cadmium telluride (CdTe). We demonstrate the performance of these detectors for PC micro-CT imaging of phantoms with up to 5 contrast materials with K-edges spread across the x-ray spectrum ranging from iodine with a K-edge at 33.2 keV to bismuth with a K-edge at 90.5 keV. We also demonstrate the use of our system to image a mouse prepared with both iodine and bismuth contrast agents to target different biological systems. When using the same dose and scan parameters, GaAs shows increased low energy (
ISSN:0031-9155
1361-6560
1361-6560
DOI:10.1088/1361-6560/acc77e