Large-Area Mapping of Voids and Dislocations in Basal-Faceted Sapphire Ribbons by Synchrotron Radiation Imaging

• Published in: Materials 2023-10, Vol.16 (19), p.6589
• Main Authors: Argunova, Tatiana S, Kohn, Victor G, Lim, Jae-Hong, Krymov, Vladimir M, Gutkin, Mikhail Yu
• Format: Article
• Language: English
• Subjects: Computer peripherals industry; Diffraction; Dislocations; Experiments; Image contrast; Light; Mapping; Microscopy; Phase contrast; Radiation; Ribbons; Sapphire; Sensors; Shape recognition; Single crystals; Spatial resolution; Synchrotron radiation; Synchrotrons; Topography; Voids; X ray imagery; X-ray diffraction; X-rays
• ISSN: 1996-1944; 1996-1944
• DOI: 10.3390/ma16196589

The understanding of structural defects in basal-faceted sapphire ribbons was improved through X-ray imaging at a synchrotron source. The combination of phase contrast and X-ray diffraction makes it possible to visualize and characterize both gas voids and dislocations in the bulk of the ribbons grown by the Stepanov–LaBelle technology. Dislocations were directly related to gas voids. X-ray diffraction topography was employed to investigate the distribution, configurations, and character of the dislocations. The formation of voids of irregular shapes was detected by large-area mapping with spatial resolution in the μm range. Computer simulations of the experimental phase contrast images of microvoids were performed. The sizes of the spherical microvoids were determined. The results are discussed with reference to the available data on the emission of dislocations from the voids. The evolution of the shape, size, and arrangement of the voids during growth provides clues on the formation of block structure in basal-faceted sapphire ribbons.