A Bayesian approach to detect QTL affecting a simulated binary and quantitative trait

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Bibliographic Details
Published in:BMC proceedings 2011-05, Vol.5 (Suppl 3), p.S4-S4
Main Authors: Bouwman, Aniek C, Janss, Luc LG, Heuven, Henri CM
Format: Article
Language:English
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Proceedings
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ISSN:1753-6561
DOI:10.1186/1753-6561-5-S3-S4