Coaxial atomic force microscope probes for imaging with dielectrophoresis

We demonstrate atomic force microscope (AFM) imaging using dielectrophoresis (DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole,...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2011-05, Vol.98 (18), p.183103-183103-3
Main Authors: Brown, Keith A., Berezovsky, Jesse, Westervelt, R. M.
Format: Article
Language:English
Subjects:
Nanoscale Science and Design
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We demonstrate atomic force microscope (AFM) imaging using dielectrophoresis (DEP) with coaxial probes. DEP provides force contrast allowing coaxial probes to image with enhanced spatial resolution. We model a coaxial probe as an electric dipole to provide analytic formulas for DEP between a dipole, dielectric spheres, and a dielectric substrate. AFM images taken of dielectric spheres with and without an applied electric field show the disappearance of artifacts when imaging with DEP. Quantitative agreement between our model and experiment shows that we are imaging with DEP.
ISSN:0003-6951
1077-3118
0003-6951
DOI:10.1063/1.3585670