Diamond X-ray photodiode for white and monochromatic SR beams

High-purity, single-crystal CVD diamond plates are screened for quality and instrumented into a sensor assembly for quantitative characterization of flux and position sensitivity. Initial investigations have yielded encouraging results and have led to further development. Several limiting complicati...

Full description

Saved in:
Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Accelerators, spectrometers, detectors and associated equipment, 2011-09, Vol.649 (1), p.91-93
Main Authors: Keister, Jeffrey W., Smedley, John, Muller, Erik M., Bohon, Jen, Héroux, Annie
Format: Article
Language:English
Subjects:
BEAM MONITORS
BEAM POSITION
BEAMS
Beams (radiation)
CHEMICAL VAPOR DEPOSITION
Detector
Detectors
Devices
Diamond
DIAMONDS
Diode
ELECTRODES
Electronics
Flux
High flux
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Linearity
MONOCHROMATIC RADIATION
MONOCRYSTALS
PHOTODIODES
PLATES
Position monitor
Responsivity
SENSITIVITY
SENSORS
Synchrotron
SYNCHROTRON RADIATION
TESTING
White beam
X-ray
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:High-purity, single-crystal CVD diamond plates are screened for quality and instrumented into a sensor assembly for quantitative characterization of flux and position sensitivity. Initial investigations have yielded encouraging results and have led to further development. Several limiting complications are observed and discussed, as well as mitigations thereof. For example, diamond quality requirements for X-ray diodes include low nitrogen impurity and crystallographic defectivity. Thin electrode windows and electronic readout performance are ultimately also critical to device performance. Promising features observed so far from prototype devices include calculable responsivity, flux linearity, position sensitivity and timing performance. Recent results from testing in high-flux and high-speed applications are described.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.11.135