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Single-step absorption and phase retrieval with polychromatic x rays using a spectral detector
In this Letter, we present a single-step method to simultaneously retrieve x-ray absorption and phase images valid for a broad range of imaging energies and material properties. Our method relies on the availability of spectrally resolved intensity measurements, which is now possible using semicondu...
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Published in: | Optics letters 2013-05, Vol.38 (9), p.1461-1463 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this Letter, we present a single-step method to simultaneously retrieve x-ray absorption and phase images valid for a broad range of imaging energies and material properties. Our method relies on the availability of spectrally resolved intensity measurements, which is now possible using semiconductor x-ray photon counting detectors. The retrieval method is derived and presented, with results showing good agreement. |
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ISSN: | 0146-9592 1539-4794 |
DOI: | 10.1364/OL.38.001461 |