Higher order harmonic detection for exploring nonlinear interactions with nanoscale resolution

Nonlinear dynamics underpin a vast array of physical phenomena ranging from interfacial motion to jamming transitions. In many cases, insight into the nonlinear behavior can be gleaned through exploration of higher order harmonics. Here, a method using band excitation scanning probe microscopy (SPM)...

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Bibliographic Details
Published in:Scientific reports 2013-09, Vol.3 (1), p.2677-2677, Article 2677
Main Authors: Vasudevan, R. K., Okatan, M. Baris, Rajapaksa, I., Kim, Y., Marincel, D., Trolier-McKinstry, S., Jesse, S., Valanoor, N., Kalinin, S. V.
Format: Article
Language:English
Subjects:
639/301
639/301/357/995
639/766/530/2803
639/925/930/328/968
Electronic properties and materials
Ferroelectrics
Humanities and Social Sciences
Laboratories
MATERIALS SCIENCE
Microscopy
multidisciplinary
NANOSCIENCE AND NANOTECHNOLOGY
Nonlinear phenomena
Nonlinear systems
Scanning
Scanning probe microscopy
Science
Science & technology - other topics
Spatial discrimination
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Summary:Nonlinear dynamics underpin a vast array of physical phenomena ranging from interfacial motion to jamming transitions. In many cases, insight into the nonlinear behavior can be gleaned through exploration of higher order harmonics. Here, a method using band excitation scanning probe microscopy (SPM) to investigate higher order harmonics of the electromechanical response, with nanometer scale spatial resolution is presented. The technique is demonstrated by probing the first three harmonics of strain for a Pb(Zr 1-x Ti x )O 3 (PZT) ferroelectric capacitor. It is shown that the second order harmonic response is correlated with the first harmonic response, whereas the third harmonic is not. Additionally, measurements of the second harmonic reveal significant deviations from Rayleigh-type models in the form of a much more complicated field dependence than is observed in the spatially averaged data. These results illustrate the versatility of n th order harmonic SPM detection methods in exploring nonlinear phenomena in nanoscale materials.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep02677