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Visible and Infra-red Light Emission in Boron-Doped Wurtzite Silicon Nanowires

Silicon, the mainstay semiconductor in microelectronic circuitry, is considered unsuitable for optoelectronic applications owing to its indirect electronic band gap, which limits its efficiency as a light emitter. Here we show the light emission properties of boron-doped wurtzite silicon nanowires m...

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Bibliographic Details
Published in:Scientific reports 2014-01, Vol.4 (1), p.3603-3603, Article 3603
Main Authors: Fabbri, Filippo, Rotunno, Enzo, Lazzarini, Laura, Fukata, Naoki, Salviati, Giancarlo
Format: Article
Language:English
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Summary:Silicon, the mainstay semiconductor in microelectronic circuitry, is considered unsuitable for optoelectronic applications owing to its indirect electronic band gap, which limits its efficiency as a light emitter. Here we show the light emission properties of boron-doped wurtzite silicon nanowires measured by cathodoluminescence spectroscopy at room temperature. A visible emission, peaked above 1.5 eV and a near infra-red emission at 0.8 eV correlate respectively to the direct transition at the Γ point and to the indirect band-gap of wurtzite silicon. We find additional intense emissions due to boron intra-gap states in the short wavelength infra-red range. We present the evolution of the light emission properties as function of the boron doping concentration and the growth temperature.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep03603