A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam

The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (10 6  s −1 for a momentum of 60 MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis usi...

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Bibliographic Details
Published in:Scientific reports 2014-05, Vol.4 (1), p.5072
Main Authors: Terada, K., Ninomiya, K., Osawa, T., Tachibana, S., Miyake, Y., Kubo, M. K., Kawamura, N., Higemoto, W., Tsuchiyama, A., Ebihara, M., Uesugi, M.
Format: Article
Language:English
Subjects:
639/766/930
704/445/209
704/445/849
Analytical chemistry
Charged particles
Cosmic rays
Earthquakes
Energy
Extraterrestrial materials
Feasibility studies
Fluorescence spectroscopy
Graphite
Humanities and Social Sciences
multidisciplinary
Science
Spectrum analysis
X-ray fluorescence
X-rays
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Summary:The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (10 6  s −1 for a momentum of 60 MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis using µ − capture. Controlling muon momentum from 32.5 to 57.5 MeV/c, we successfully demonstrate a depth-profile analysis of light elements (B, C, N and O) from several mm-thick layered materials and non-destructive bulk analyses of meteorites containing organic materials. Muon beam analysis, enabling a bulk analysis of light to heavy elements without severe radioactivation, is a unique analytical method complementary to other non-destructive analyses. Furthermore, this technology can be used as a powerful tool to identify the content and distribution of organic components in future asteroidal return samples.
ISSN:2045-2322
DOI:10.1038/srep05072