Coherent imaging at the diffraction limit

X‐ray ptychography, a scanning coherent diffractive imaging technique, holds promise for imaging with dose‐limited resolution and sensitivity. If the foreseen increase of coherent flux by orders of magnitude can be matched by additional technological and analytical advances, ptychography may approac...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2014-09, Vol.21 (5), p.1011-1018
Main Authors: Thibault, Pierre, Guizar-Sicairos, Manuel, Menzel, Andreas
Format: Article
Language:English
Subjects:
Coherence
coherent diffraction
Diffraction
Diffraction-Limited Storage Rings
diffraction-limited synchrotron sources
Flux
Imaging
Mathematical analysis
Metrology
ptychography
Synchrotron radiation
Three dimensional
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Summary:X‐ray ptychography, a scanning coherent diffractive imaging technique, holds promise for imaging with dose‐limited resolution and sensitivity. If the foreseen increase of coherent flux by orders of magnitude can be matched by additional technological and analytical advances, ptychography may approach imaging speeds familiar from full‐field methods while retaining its inherently quantitative nature and metrological versatility. Beyond promises of high throughput, spectroscopic applications in three dimensions become feasible, as do measurements of sample dynamics through time‐resolved imaging or careful characterization of decoherence effects.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577514015343