Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysis

X‐ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single‐pulse free‐electron laser beam diagnostic was tested for two typical focusing configurations. The res...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2015-05, Vol.22 (3), p.599-605
Main Authors: Sikorski, Marcin, Song, Sanghoon, Schropp, Andreas, Seiboth, Frank, Feng, Yiping, Alonso-Mori, Roberto, Chollet, Matthieu, Lemke, Henrik T., Sokaras, Dimosthenis, Weng, Tsu-Chien, Zhang, Wenkai, Robert, Aymeric, Zhu, Diling
Format: Article
Language:English
Subjects:
FEL
focusing
Free-Electron Lasers
Lasers
PARTICLE ACCELERATORS
speckle
X-ray
X-ray FEL
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Summary:X‐ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single‐pulse free‐electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus' location, size and shape. In addition, its single‐pulse compatibility enables users to capture pulse‐to‐pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577515004361