In situ bending of an Au nanowire monitored by micro Laue diffraction

This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using...

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Bibliographic Details
Published in:Journal of applied crystallography 2015-02, Vol.48 (1), p.291-296
Main Authors: Leclere, Cédric, Cornelius, Thomas W., Ren, Zhe, Davydok, Anton, Micha, Jean-Sébastien, Robach, Odile, Richter, Gunther, Belliard, Laurent, Thomas, Olivier
Format: Article
Language:English
Subjects:
Au nanowires
Condensed Matter
Crystallography
Diffraction
Mechanical properties
micro-beam Laue diffraction
nanomechanical testing
Nanowires
Physics
Research Papers
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Summary:This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self‐suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576715001107