In situ bending of an Au nanowire monitored by micro Laue diffraction

This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using...

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Published in:Journal of applied crystallography 2015-02, Vol.48 (1), p.291-296
Main Authors: Leclere, Cédric, Cornelius, Thomas W., Ren, Zhe, Davydok, Anton, Micha, Jean-Sébastien, Robach, Odile, Richter, Gunther, Belliard, Laurent, Thomas, Olivier
Format: Article
Language:English
Subjects:
Au nanowires
Condensed Matter
Crystallography
Diffraction
Mechanical properties
micro-beam Laue diffraction
nanomechanical testing
Nanowires
Physics
Research Papers
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cited_by cdi_FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13
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container_end_page 296
container_issue 1
container_start_page 291
container_title Journal of applied crystallography
container_volume 48
creator Leclere, Cédric
Cornelius, Thomas W.
Ren, Zhe
Davydok, Anton
Micha, Jean-Sébastien
Robach, Odile
Richter, Gunther
Belliard, Laurent
Thomas, Olivier
description This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self‐suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.
doi_str_mv 10.1107/S1600576715001107
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fullrecord <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4453168</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3576130261</sourcerecordid><originalsourceid>FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13</originalsourceid><addsrcrecordid>eNqFUUlLxDAYDaK4jP4ALxLw5KGar2mS9iKMo47LoOCC4CWkbarRmWRMW3X-vS3VweXgKeHlLbw8hDaB7AIQsXcNnBAmuABGSIssoNUWClps8dt9Ba2V5VPD4SIMl9FKyEmcCAar6OjU4tJUNU61zY19wK7AyuJ-ja2y7s14jSfOmsp5neN0hicm8w6PVK1xborCq6wyzq6jpUKNS73xefbQ7fHRzeAkGF0OTwf9UZAxwiEAymOqaJQqUJAnoiAp5zQmYRwKRUXGgae84DTXkGqW0yRJ46YZyyAUMWRAe2i_853W6UTnmbaVV2M59Wai_Ew6ZeTPF2se5YN7lVHEKDThPbTTGTz-kp30R7LFCISUiiR-bcO2P8O8e6l1WcknV3vb9JPAGYHWkzYs6FjNv5Sl18XcFohsN5F_Vmo0W99rzBVfszSEpCO8mbGe_e8ozwZX4cUBg6jVBp3WlJV-n2uVf5ZcUMHk3cVQXh8m0dmQ3Mtz-gFTMKmS</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1650144533</pqid></control><display><type>article</type><title>In situ bending of an Au nanowire monitored by micro Laue diffraction</title><source>Wiley-Blackwell Read &amp; Publish Collection</source><creator>Leclere, Cédric ; Cornelius, Thomas W. ; Ren, Zhe ; Davydok, Anton ; Micha, Jean-Sébastien ; Robach, Odile ; Richter, Gunther ; Belliard, Laurent ; Thomas, Olivier</creator><creatorcontrib>Leclere, Cédric ; Cornelius, Thomas W. ; Ren, Zhe ; Davydok, Anton ; Micha, Jean-Sébastien ; Robach, Odile ; Richter, Gunther ; Belliard, Laurent ; Thomas, Olivier</creatorcontrib><description>This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self‐suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.</description><identifier>ISSN: 1600-5767</identifier><identifier>ISSN: 0021-8898</identifier><identifier>EISSN: 1600-5767</identifier><identifier>DOI: 10.1107/S1600576715001107</identifier><identifier>PMID: 26089751</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography</publisher><subject>Au nanowires ; Condensed Matter ; Crystallography ; Diffraction ; Mechanical properties ; micro-beam Laue diffraction ; nanomechanical testing ; Nanowires ; Physics ; Research Papers</subject><ispartof>Journal of applied crystallography, 2015-02, Vol.48 (1), p.291-296</ispartof><rights>Cédric Leclere et al . 2015</rights><rights>Cédric Leclere et al . 2015</rights><rights>Attribution</rights><rights>Cédric Leclere et al. 2015 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13</citedby><cites>FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13</cites><orcidid>0000-0003-4272-4720 ; 0000-0002-2027-8283 ; 0000-0002-5708-1409</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,776,780,881,27903,27904</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/26089751$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-01233798$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Leclere, Cédric</creatorcontrib><creatorcontrib>Cornelius, Thomas W.</creatorcontrib><creatorcontrib>Ren, Zhe</creatorcontrib><creatorcontrib>Davydok, Anton</creatorcontrib><creatorcontrib>Micha, Jean-Sébastien</creatorcontrib><creatorcontrib>Robach, Odile</creatorcontrib><creatorcontrib>Richter, Gunther</creatorcontrib><creatorcontrib>Belliard, Laurent</creatorcontrib><creatorcontrib>Thomas, Olivier</creatorcontrib><title>In situ bending of an Au nanowire monitored by micro Laue diffraction</title><title>Journal of applied crystallography</title><addtitle>Jnl Applied Crystallography</addtitle><description>This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self‐suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.</description><subject>Au nanowires</subject><subject>Condensed Matter</subject><subject>Crystallography</subject><subject>Diffraction</subject><subject>Mechanical properties</subject><subject>micro-beam Laue diffraction</subject><subject>nanomechanical testing</subject><subject>Nanowires</subject><subject>Physics</subject><subject>Research Papers</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><recordid>eNqFUUlLxDAYDaK4jP4ALxLw5KGar2mS9iKMo47LoOCC4CWkbarRmWRMW3X-vS3VweXgKeHlLbw8hDaB7AIQsXcNnBAmuABGSIssoNUWClps8dt9Ba2V5VPD4SIMl9FKyEmcCAar6OjU4tJUNU61zY19wK7AyuJ-ja2y7s14jSfOmsp5neN0hicm8w6PVK1xborCq6wyzq6jpUKNS73xefbQ7fHRzeAkGF0OTwf9UZAxwiEAymOqaJQqUJAnoiAp5zQmYRwKRUXGgae84DTXkGqW0yRJ46YZyyAUMWRAe2i_853W6UTnmbaVV2M59Wai_Ew6ZeTPF2se5YN7lVHEKDThPbTTGTz-kp30R7LFCISUiiR-bcO2P8O8e6l1WcknV3vb9JPAGYHWkzYs6FjNv5Sl18XcFohsN5F_Vmo0W99rzBVfszSEpCO8mbGe_e8ozwZX4cUBg6jVBp3WlJV-n2uVf5ZcUMHk3cVQXh8m0dmQ3Mtz-gFTMKmS</recordid><startdate>201502</startdate><enddate>201502</enddate><creator>Leclere, Cédric</creator><creator>Cornelius, Thomas W.</creator><creator>Ren, Zhe</creator><creator>Davydok, Anton</creator><creator>Micha, Jean-Sébastien</creator><creator>Robach, Odile</creator><creator>Richter, Gunther</creator><creator>Belliard, Laurent</creator><creator>Thomas, Olivier</creator><general>International Union of Crystallography</general><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>24P</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope><scope>VOOES</scope><scope>5PM</scope><orcidid>https://orcid.org/0000-0003-4272-4720</orcidid><orcidid>https://orcid.org/0000-0002-2027-8283</orcidid><orcidid>https://orcid.org/0000-0002-5708-1409</orcidid></search><sort><creationdate>201502</creationdate><title>In situ bending of an Au nanowire monitored by micro Laue diffraction</title><author>Leclere, Cédric ; Cornelius, Thomas W. ; Ren, Zhe ; Davydok, Anton ; Micha, Jean-Sébastien ; Robach, Odile ; Richter, Gunther ; Belliard, Laurent ; Thomas, Olivier</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Au nanowires</topic><topic>Condensed Matter</topic><topic>Crystallography</topic><topic>Diffraction</topic><topic>Mechanical properties</topic><topic>micro-beam Laue diffraction</topic><topic>nanomechanical testing</topic><topic>Nanowires</topic><topic>Physics</topic><topic>Research Papers</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Leclere, Cédric</creatorcontrib><creatorcontrib>Cornelius, Thomas W.</creatorcontrib><creatorcontrib>Ren, Zhe</creatorcontrib><creatorcontrib>Davydok, Anton</creatorcontrib><creatorcontrib>Micha, Jean-Sébastien</creatorcontrib><creatorcontrib>Robach, Odile</creatorcontrib><creatorcontrib>Richter, Gunther</creatorcontrib><creatorcontrib>Belliard, Laurent</creatorcontrib><creatorcontrib>Thomas, Olivier</creatorcontrib><collection>Istex</collection><collection>Wiley Online Library</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Leclere, Cédric</au><au>Cornelius, Thomas W.</au><au>Ren, Zhe</au><au>Davydok, Anton</au><au>Micha, Jean-Sébastien</au><au>Robach, Odile</au><au>Richter, Gunther</au><au>Belliard, Laurent</au><au>Thomas, Olivier</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In situ bending of an Au nanowire monitored by micro Laue diffraction</atitle><jtitle>Journal of applied crystallography</jtitle><addtitle>Jnl Applied Crystallography</addtitle><date>2015-02</date><risdate>2015</risdate><volume>48</volume><issue>1</issue><spage>291</spage><epage>296</epage><pages>291-296</pages><issn>1600-5767</issn><issn>0021-8898</issn><eissn>1600-5767</eissn><abstract>This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three‐point bending on self‐suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self‐suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.</abstract><cop>5 Abbey Square, Chester, Cheshire CH1 2HU, England</cop><pub>International Union of Crystallography</pub><pmid>26089751</pmid><doi>10.1107/S1600576715001107</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0003-4272-4720</orcidid><orcidid>https://orcid.org/0000-0002-2027-8283</orcidid><orcidid>https://orcid.org/0000-0002-5708-1409</orcidid><oa>free_for_read</oa></addata></record>
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0021-8898
1600-5767
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source Wiley-Blackwell Read & Publish Collection
subjects Au nanowires
Condensed Matter
Crystallography
Diffraction
Mechanical properties
micro-beam Laue diffraction
nanomechanical testing
Nanowires
Physics
Research Papers
title In situ bending of an Au nanowire monitored by micro Laue diffraction
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T17%3A02%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=In%20situ%20bending%20of%20an%20Au%20nanowire%20monitored%20by%20micro%20Laue%20diffraction&rft.jtitle=Journal%20of%20applied%20crystallography&rft.au=Leclere,%20C%C3%A9dric&rft.date=2015-02&rft.volume=48&rft.issue=1&rft.spage=291&rft.epage=296&rft.pages=291-296&rft.issn=1600-5767&rft.eissn=1600-5767&rft_id=info:doi/10.1107/S1600576715001107&rft_dat=%3Cproquest_pubme%3E3576130261%3C/proquest_pubme%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c5061-13683a34ba1a1d97f0b663802827a37c616b6f63de1be5d399b85005c12781c13%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1650144533&rft_id=info:pmid/26089751&rfr_iscdi=true