Probing of multiple magnetic responses in magnetic inductors using atomic force microscopy

Even though nanoscale analysis of magnetic properties is of significant interest, probing methods are relatively less developed compared to the significance of the technique, which has multiple potential applications. Here, we demonstrate an approach for probing various magnetic properties associate...

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Bibliographic Details
Published in:Scientific reports 2016-02, Vol.6 (1), p.20794-20794, Article 20794
Main Authors: Park, Seongjae, Seo, Hosung, Seol, Daehee, Yoon, Young-Hwan, Kim, Mi Yang, Kim, Yunseok
Format: Article
Language:English
Subjects:
639/301
639/301/930
Atomic force microscopy
Humanities and Social Sciences
Magnetic properties
Magnetism
Microscopy
multidisciplinary
Science
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Summary:Even though nanoscale analysis of magnetic properties is of significant interest, probing methods are relatively less developed compared to the significance of the technique, which has multiple potential applications. Here, we demonstrate an approach for probing various magnetic properties associated with eddy current, coil current and magnetic domains in magnetic inductors using multidimensional magnetic force microscopy (MMFM). The MMFM images provide combined magnetic responses from the three different origins, however, each contribution to the MMFM response can be differentiated through analysis based on the bias dependence of the response. In particular, the bias dependent MMFM images show locally different eddy current behavior with values dependent on the type of materials that comprise the MI. This approach for probing magnetic responses can be further extended to the analysis of local physical features.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep20794