Spatially multiplexed dark-field microspectrophotometry for nanoplasmonics

Monitoring the effect of the substrate on the local surface plasmon resonance (LSPR) of metallic nanoparticles is key for deepening our understanding of light-matter interactions at the nanoscale. This coupling gives rise to shifts of the LSPR as well as changes in the scattering pattern shape. The...

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Bibliographic Details
Published in:Scientific reports 2016-03, Vol.6 (1), p.22836-22836, Article 22836
Main Authors: Pini, V., Kosaka, P. M., Ruz, J. J., Malvar, O., Encinar, M., Tamayo, J., Calleja, M.
Format: Article
Language:English
Subjects:
639/624
639/925
Humanities and Social Sciences
Light intensity
Mapping
Monomers
multidisciplinary
Nanoparticles
Polarization
Science
Silicon
Spatial analysis
Spatial distribution
Spectral analysis
Spectrophotometry
Surface area
Surface plasmon resonance
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Summary:Monitoring the effect of the substrate on the local surface plasmon resonance (LSPR) of metallic nanoparticles is key for deepening our understanding of light-matter interactions at the nanoscale. This coupling gives rise to shifts of the LSPR as well as changes in the scattering pattern shape. The problem requires of high-throughput techniques that present both high spatial and spectral resolution. We present here a technique, referred to as Spatially Multiplexed Micro-Spectrophotometry (SMMS), able to perform polarization-resolved spectral and spatial analysis of the scattered light over large surface areas. The SMMS technique provides three orders of magnitude faster spectroscopic analysis than conventional dark-field microspectrophotometry, with the capability for mapping the spatial distribution of the scattered light intensity with lateral resolution of 40 nm over surface areas of 0.02 mm 2 . We show polarization-resolved dark-field spectral analysis of hundreds of gold nanoparticles deposited on a silicon surface. The technique allows determining the effect of the substrate on the LSPR of single nanoparticles and dimers and their scattering patterns. This is applied for rapid discrimination and counting of monomers and dimers of nanoparticles. In addition, the diameter of individual nanoparticles can be rapidly assessed with 1 nm accuracy.
ISSN:2045-2322
2045-2322
DOI:10.1038/srep22836