Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

Wavelength‐dispersive high‐resolution X‐ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analy...

Full description

Saved in:
Bibliographic Details
Published in:Journal of synchrotron radiation 2014-07, Vol.21 (4), p.762-767
Main Authors: Honkanen, Ari-Pekka, Verbeni, Roberto, Simonelli, Laura, Moretti Sala, Marco, Al-Zein, Ali, Krisch, Michael, Monaco, Giulio, Huotari, Simo
Format: Article
Language:English
Subjects:
bent analyser crystals
Crystals
Energy resolution
Photons
Physics
position-sensitive detectors
Research Papers
Residual stress
Satellites
Spectrometers
Synchrotron radiation
Synchrotrons
X-ray spectrometers
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Wavelength‐dispersive high‐resolution X‐ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanen et al. (2014). J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann‐type spectrometer using a spherically bent Si(660) analyser in near‐backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577514011163