Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination

Energy-filtered (or selected) electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that imag...

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Published in:Journal of research of the National Institute of Standards and Technology 1997-01, Vol.102 (1), p.1-13
Main Authors: Wang, Z L, van Heerden, D, Josell, D, Shapiro, A J
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van Heerden, D
Josell, D
Shapiro, A J
description Energy-filtered (or selected) electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that image contrast can be dramatically improved with the use of an energy filter. High-resolution chemical-sensitive imaging using ionization-loss electrons is demonstrated in studies of Ni/Ti and Al/Ti multilayer thin films. It is also shown that the spatial resolution of energy-selected ionization edge electron images is dominated by the signal-to-noise ratio. Experimental parameters which may be selected to improve the signal-to-noise ratio are discussed.
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fullrecord <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4902563</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27255523</sourcerecordid><originalsourceid>FETCH-LOGICAL-c466t-dd9bef7de829e7f1526928d1bb790b47bf7b01a65f73802c7fb3537191ce10623</originalsourceid><addsrcrecordid>eNp9kc9rFDEUx4NY7Fq9eZbBg3hw1vxO5lKQurWFimgVvIVM5s1ultnJmmQK-9-bobVoD32X9x758OXl-0XoFcFLian-sI2QlgTTJcb0CVpQIkWtqOBP0YJgzmup1K9j9DylLS4lefMMHVOlsSBULNBmNUJcH-pzP2SI0FUXfr2pv0MKw5R9GKvVAC7HMnzxLobkwv5Q9SFW3yY7Zp9t9jdQXYfBd9V12cqc4-TyFKH6BEVy50c7C71AR70dEry86yfo5_nqx9lFffX18-XZx6vacSlz3XVNC73qQNMGVE8ElQ3VHWlb1eCWq7ZXLSZWil4xjalTfcsEU6QhDgiWlJ2g01vd_dTuoHMw5mgHs49-Z-PBBOvN_y-j35h1uDG8wVRIVgTe3gnE8HuClM3OJwfDYEcIUzK0mCsEncF3j4JEMyGY1IwX9M0DdBumOBYfDCVc6UZwXaD3t9Dsc4rQ3x9NsJmjNnPUZaGmRF3w1_9-9B7-my37Az7lpxc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>214789548</pqid></control><display><type>article</type><title>Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination</title><source>Open Access: PubMed Central</source><source>Publicly Available Content Database (ProQuest Open Access資料庫)</source><creator>Wang, Z L ; van Heerden, D ; Josell, D ; Shapiro, A J</creator><creatorcontrib>Wang, Z L ; van Heerden, D ; Josell, D ; Shapiro, A J</creatorcontrib><description>Energy-filtered (or selected) electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that image contrast can be dramatically improved with the use of an energy filter. High-resolution chemical-sensitive imaging using ionization-loss electrons is demonstrated in studies of Ni/Ti and Al/Ti multilayer thin films. It is also shown that the spatial resolution of energy-selected ionization edge electron images is dominated by the signal-to-noise ratio. Experimental parameters which may be selected to improve the signal-to-noise ratio are discussed.</description><identifier>ISSN: 1044-677X</identifier><identifier>EISSN: 2165-7254</identifier><identifier>DOI: 10.6028/jres.102.002</identifier><identifier>PMID: 27805125</identifier><identifier>CODEN: JRITEF</identifier><language>eng</language><publisher>United States: Superintendent of Documents</publisher><ispartof>Journal of research of the National Institute of Standards and Technology, 1997-01, Vol.102 (1), p.1-13</ispartof><rights>Copyright Superintendent of Documents Jan/Feb 1997</rights><rights>1997</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c466t-dd9bef7de829e7f1526928d1bb790b47bf7b01a65f73802c7fb3537191ce10623</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/214789548/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/214789548?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>230,314,727,780,784,885,25753,27924,27925,37012,37013,44590,53791,53793,75126</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27805125$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Wang, Z L</creatorcontrib><creatorcontrib>van Heerden, D</creatorcontrib><creatorcontrib>Josell, D</creatorcontrib><creatorcontrib>Shapiro, A J</creatorcontrib><title>Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination</title><title>Journal of research of the National Institute of Standards and Technology</title><addtitle>J Res Natl Inst Stand Technol</addtitle><description>Energy-filtered (or selected) electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that image contrast can be dramatically improved with the use of an energy filter. High-resolution chemical-sensitive imaging using ionization-loss electrons is demonstrated in studies of Ni/Ti and Al/Ti multilayer thin films. It is also shown that the spatial resolution of energy-selected ionization edge electron images is dominated by the signal-to-noise ratio. Experimental parameters which may be selected to improve the signal-to-noise ratio are discussed.</description><issn>1044-677X</issn><issn>2165-7254</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNp9kc9rFDEUx4NY7Fq9eZbBg3hw1vxO5lKQurWFimgVvIVM5s1ultnJmmQK-9-bobVoD32X9x758OXl-0XoFcFLian-sI2QlgTTJcb0CVpQIkWtqOBP0YJgzmup1K9j9DylLS4lefMMHVOlsSBULNBmNUJcH-pzP2SI0FUXfr2pv0MKw5R9GKvVAC7HMnzxLobkwv5Q9SFW3yY7Zp9t9jdQXYfBd9V12cqc4-TyFKH6BEVy50c7C71AR70dEry86yfo5_nqx9lFffX18-XZx6vacSlz3XVNC73qQNMGVE8ElQ3VHWlb1eCWq7ZXLSZWil4xjalTfcsEU6QhDgiWlJ2g01vd_dTuoHMw5mgHs49-Z-PBBOvN_y-j35h1uDG8wVRIVgTe3gnE8HuClM3OJwfDYEcIUzK0mCsEncF3j4JEMyGY1IwX9M0DdBumOBYfDCVc6UZwXaD3t9Dsc4rQ3x9NsJmjNnPUZaGmRF3w1_9-9B7-my37Az7lpxc</recordid><startdate>199701</startdate><enddate>199701</enddate><creator>Wang, Z L</creator><creator>van Heerden, D</creator><creator>Josell, D</creator><creator>Shapiro, A J</creator><general>Superintendent of Documents</general><general>[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>4S-</scope><scope>4T-</scope><scope>4U-</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>BKSAR</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>M2O</scope><scope>M2P</scope><scope>MBDVC</scope><scope>PADUT</scope><scope>PCBAR</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>Q9U</scope><scope>S0X</scope><scope>7X8</scope><scope>8BQ</scope><scope>8FD</scope><scope>H8D</scope><scope>JG9</scope><scope>L7M</scope><scope>5PM</scope></search><sort><creationdate>199701</creationdate><title>Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination</title><author>Wang, Z L ; van Heerden, D ; Josell, D ; Shapiro, A J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c466t-dd9bef7de829e7f1526928d1bb790b47bf7b01a65f73802c7fb3537191ce10623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Wang, Z L</creatorcontrib><creatorcontrib>van Heerden, D</creatorcontrib><creatorcontrib>Josell, D</creatorcontrib><creatorcontrib>Shapiro, A J</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>BPIR.com Limited</collection><collection>Docstoc</collection><collection>University Readers</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Earth, Atmospheric &amp; Aquatic Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest research library</collection><collection>ProQuest Science Journals</collection><collection>Research Library (Corporate)</collection><collection>Research Library China</collection><collection>Earth, Atmospheric &amp; Aquatic Science Database</collection><collection>Materials science collection</collection><collection>Publicly Available Content Database (ProQuest Open Access資料庫)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><collection>MEDLINE - Academic</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Journal of research of the National Institute of Standards and Technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Z L</au><au>van Heerden, D</au><au>Josell, D</au><au>Shapiro, A J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination</atitle><jtitle>Journal of research of the National Institute of Standards and Technology</jtitle><addtitle>J Res Natl Inst Stand Technol</addtitle><date>1997-01</date><risdate>1997</risdate><volume>102</volume><issue>1</issue><spage>1</spage><epage>13</epage><pages>1-13</pages><issn>1044-677X</issn><eissn>2165-7254</eissn><coden>JRITEF</coden><abstract>Energy-filtered (or selected) electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, the characteristics and applications of energy-selected electron imaging at high-resolution for structure determinations are illustrated. It is shown that image contrast can be dramatically improved with the use of an energy filter. High-resolution chemical-sensitive imaging using ionization-loss electrons is demonstrated in studies of Ni/Ti and Al/Ti multilayer thin films. It is also shown that the spatial resolution of energy-selected ionization edge electron images is dominated by the signal-to-noise ratio. Experimental parameters which may be selected to improve the signal-to-noise ratio are discussed.</abstract><cop>United States</cop><pub>Superintendent of Documents</pub><pmid>27805125</pmid><doi>10.6028/jres.102.002</doi><tpages>13</tpages><oa>free_for_read</oa></addata></record>
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2165-7254
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recordid cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4902563
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title Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T07%3A42%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Energy-Filtered%20High-Resolution%20Electron%20Microscopy%20for%20Quantitative%20Solid%20State%20Structure%20Determination&rft.jtitle=Journal%20of%20research%20of%20the%20National%20Institute%20of%20Standards%20and%20Technology&rft.au=Wang,%20Z%20L&rft.date=1997-01&rft.volume=102&rft.issue=1&rft.spage=1&rft.epage=13&rft.pages=1-13&rft.issn=1044-677X&rft.eissn=2165-7254&rft.coden=JRITEF&rft_id=info:doi/10.6028/jres.102.002&rft_dat=%3Cproquest_pubme%3E27255523%3C/proquest_pubme%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c466t-dd9bef7de829e7f1526928d1bb790b47bf7b01a65f73802c7fb3537191ce10623%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=214789548&rft_id=info:pmid/27805125&rfr_iscdi=true