Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials

• Published in: Scanning 2017-01, Vol.2017 (2017), p.1-11
• Main Authors: Shen, Yajing, Zhang, Hongti, Lu, Haojian, Jiang, Chenchen, Lu, Yang
• Format: Article
• Language: English
• Subjects: Deformation mechanisms; Electrical properties; Failure mechanisms; Mechanical properties; Microscopes; Nanomaterials; Nanostructure; Review; Scanning electron microscopy
• ISSN: 0161-0457; 1932-8745
• DOI: 10.1155/2017/1985149

In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the fundamental deformation and failure mechanisms for their device applications. In this overview, we summarized recent developments on in situ SEM-based mechanical and electrical characterization techniques including tensile, compression, bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis. In addition, the advantages and disadvantages of in situ SEM tests were also discussed with some possible solutions to address the challenges. Furthermore, critical challenges were also discussed for the development and design of robust in situ SEM characterization platform with higher resolution and wider range of samples. These experimental efforts have offered in-depth understanding on the mechanical and electrical properties of low-dimensional nanomaterial components and given guidelines for their further structural and functional applications.