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Estimation of the ion-trap assisted electrical loads and resulting BBR shift
Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF reson...
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Published in: | Scientific reports 2018-11, Vol.8 (1), p.16884-10, Article 16884 |
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description | Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF resonator. Of particular relevance to the trapped ion optical atomic clock, determination of these loads lead to accurate evaluation of the Black-Body Radiation (BBR) shift resulting from the inaccurate machining of the ion-trap itself. We have identified different sources of these loads and estimated their values using analytical and finite element analysis methods, which are found to be well in agreement with the experimentally measured values. For our trap geometry, we obtained values of the effective inductive, capacitive and resistive loads as: 3.1
μ
H, 3.71 (1)
μ
H, 3.68 (6)
μ
H; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10
−17
for an RF of 1 kV at 2
π
× 15 MHz and with ±10
μ
m machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks. |
doi_str_mv | 10.1038/s41598-018-35234-5 |
format | article |
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μ
H, 3.71 (1)
μ
H, 3.68 (6)
μ
H; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10
−17
for an RF of 1 kV at 2
π
× 15 MHz and with ±10
μ
m machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks.</description><identifier>ISSN: 2045-2322</identifier><identifier>EISSN: 2045-2322</identifier><identifier>DOI: 10.1038/s41598-018-35234-5</identifier><identifier>PMID: 30443030</identifier><language>eng</language><publisher>London: Nature Publishing Group UK</publisher><subject>639/766/36 ; 639/766/36/1121 ; Experimental methods ; Humanities and Social Sciences ; multidisciplinary ; Radiation ; Science ; Science (multidisciplinary)</subject><ispartof>Scientific reports, 2018-11, Vol.8 (1), p.16884-10, Article 16884</ispartof><rights>The Author(s) 2018</rights><rights>2018. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c474t-5b978ed9d593bd67cc3bda7957a41dd7292829c2661eb93baaf16ddc9429a85d3</citedby><cites>FETCH-LOGICAL-c474t-5b978ed9d593bd67cc3bda7957a41dd7292829c2661eb93baaf16ddc9429a85d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2314540785/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2314540785?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>230,314,727,780,784,885,25753,27924,27925,37012,37013,44590,53791,53793,75126</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/30443030$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sharma, Lakhi</creatorcontrib><creatorcontrib>Roy, A.</creatorcontrib><creatorcontrib>Panja, S.</creatorcontrib><creatorcontrib>Ojha, V. N.</creatorcontrib><creatorcontrib>De, S.</creatorcontrib><title>Estimation of the ion-trap assisted electrical loads and resulting BBR shift</title><title>Scientific reports</title><addtitle>Sci Rep</addtitle><addtitle>Sci Rep</addtitle><description>Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF resonator. Of particular relevance to the trapped ion optical atomic clock, determination of these loads lead to accurate evaluation of the Black-Body Radiation (BBR) shift resulting from the inaccurate machining of the ion-trap itself. We have identified different sources of these loads and estimated their values using analytical and finite element analysis methods, which are found to be well in agreement with the experimentally measured values. For our trap geometry, we obtained values of the effective inductive, capacitive and resistive loads as: 3.1
μ
H, 3.71 (1)
μ
H, 3.68 (6)
μ
H; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10
−17
for an RF of 1 kV at 2
π
× 15 MHz and with ±10
μ
m machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks.</description><subject>639/766/36</subject><subject>639/766/36/1121</subject><subject>Experimental methods</subject><subject>Humanities and Social Sciences</subject><subject>multidisciplinary</subject><subject>Radiation</subject><subject>Science</subject><subject>Science (multidisciplinary)</subject><issn>2045-2322</issn><issn>2045-2322</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNp9kV9rFDEUxYNYbGn7BXyQgC--jCY3yWTyIthS_8CCUOpzyCaZ3ZTZyZqbKfjtTd1aqw_m5V64v3tyD4eQl5y95UwM71ByZYaO8aETCoTs1DNyAkyqDgTA8yf9MTlHvGXtKTCSmxfkWDApBRPshKyusKadqynPNI-0biNtbVeL21OHmLDGQOMUfS3Ju4lO2QWkbg60RFymmuYNvbi4prhNYz0jR6ObMJ4_1FPy7ePVzeXnbvX105fLD6vOSy1rp9ZGDzGYoIxYh15734rTRmkneQgaDAxgPPQ9j-uGODfyPgRvJBg3qCBOyfuD7n5Z72LwcW73TnZfmpPyw2aX7N-TOW3tJt_ZHoQeQDSBNw8CJX9fIla7S-jjNLk55gUtcKE45wC6oa__QW_zUuZmz4LgUkmmB9UoOFC-ZMQSx8djOLP3edlDXrblZX_lZe-XXj218bjyO50GiAOAbTRvYvnz939kfwKUp6Cu</recordid><startdate>20181115</startdate><enddate>20181115</enddate><creator>Sharma, Lakhi</creator><creator>Roy, A.</creator><creator>Panja, S.</creator><creator>Ojha, V. 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N. ; De, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c474t-5b978ed9d593bd67cc3bda7957a41dd7292829c2661eb93baaf16ddc9429a85d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>639/766/36</topic><topic>639/766/36/1121</topic><topic>Experimental methods</topic><topic>Humanities and Social Sciences</topic><topic>multidisciplinary</topic><topic>Radiation</topic><topic>Science</topic><topic>Science (multidisciplinary)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sharma, Lakhi</creatorcontrib><creatorcontrib>Roy, A.</creatorcontrib><creatorcontrib>Panja, S.</creatorcontrib><creatorcontrib>Ojha, V. N.</creatorcontrib><creatorcontrib>De, S.</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Health & Medical Collection (Proquest)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Biology Database (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>ProQuest Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Science Database (ProQuest)</collection><collection>ProQuest Biological Science Journals</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Scientific reports</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sharma, Lakhi</au><au>Roy, A.</au><au>Panja, S.</au><au>Ojha, V. N.</au><au>De, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Estimation of the ion-trap assisted electrical loads and resulting BBR shift</atitle><jtitle>Scientific reports</jtitle><stitle>Sci Rep</stitle><addtitle>Sci Rep</addtitle><date>2018-11-15</date><risdate>2018</risdate><volume>8</volume><issue>1</issue><spage>16884</spage><epage>10</epage><pages>16884-10</pages><artnum>16884</artnum><issn>2045-2322</issn><eissn>2045-2322</eissn><abstract>Capacitive, inductive and resistive loads of an ion-trap system, which can be modelled as LCR circuits, are important to know for building a high accuracy experiment. Accurate estimation of these loads is necessary for delivering the desired radio frequency (RF) signal to an ion trap via an RF resonator. Of particular relevance to the trapped ion optical atomic clock, determination of these loads lead to accurate evaluation of the Black-Body Radiation (BBR) shift resulting from the inaccurate machining of the ion-trap itself. We have identified different sources of these loads and estimated their values using analytical and finite element analysis methods, which are found to be well in agreement with the experimentally measured values. For our trap geometry, we obtained values of the effective inductive, capacitive and resistive loads as: 3.1
μ
H, 3.71 (1)
μ
H, 3.68 (6)
μ
H; 50.4 pF, 51.4 (7) pF, 40.7 (2) pF; and 1.373 Ω, 1.273 (3) Ω, 1.183 (9) Ω by using analytical, numerical and experimental methods, respectively. The BBR shift induced by the excess capacitive load arising due to machining inaccuracy in the RF carrying parts has been accurately estimated, which results to a fractional frequency shift of 6.6 × 10
−17
for an RF of 1 kV at 2
π
× 15 MHz and with ±10
μ
m machining inaccuracy. This needs to be incorporated into the total systematic uncertainty budget of a frequency standard as it is about one order of magnitude higher than the present precision of the trapped ion optical clocks.</abstract><cop>London</cop><pub>Nature Publishing Group UK</pub><pmid>30443030</pmid><doi>10.1038/s41598-018-35234-5</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record> |
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subjects | 639/766/36 639/766/36/1121 Experimental methods Humanities and Social Sciences multidisciplinary Radiation Science Science (multidisciplinary) |
title | Estimation of the ion-trap assisted electrical loads and resulting BBR shift |
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