Quantitative determination of a model organic/insulator/metal interface structure

By combining X-ray photoelectron spectroscopy, X-ray standing waves and scanning tunneling microscopy, we investigate the geometric and electronic structure of a prototypical organic/insulator/metal interface, namely cobalt porphine on monolayer hexagonal boron nitride (h-BN) on Cu(111). Specificall...

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Bibliographic Details
Published in:Nanoscale 2018-11, Vol.10 (46), p.21971-21977
Main Authors: Schwarz, Martin, Duncan, David A, Garnica, Manuela, Ducke, Jacob, Deimel, Peter S, Thakur, Pardeep K, Lee, Tien-Lin, Allegretti, Francesco, Auwärter, Willi
Format: Article
Language:English
Subjects:
Adsorption
Bonding strength
Boron nitride
Chemical bonds
Chemistry
Decoupling
Electronic structure
Molecular conformation
Photoelectrons
Standing waves
Temperature dependence
X ray photoelectron spectroscopy
X ray spectra
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Summary:By combining X-ray photoelectron spectroscopy, X-ray standing waves and scanning tunneling microscopy, we investigate the geometric and electronic structure of a prototypical organic/insulator/metal interface, namely cobalt porphine on monolayer hexagonal boron nitride (h-BN) on Cu(111). Specifically, we determine the adsorption height of the organic molecule and show that the original planar molecular conformation is preserved in contrast to the adsorption on Cu(111). In addition, we highlight the electronic decoupling provided by the h-BN spacer layer and find that the h-BN-metal separation is not significantly modified by the molecular adsorption. Finally, we find indication of a temperature dependence of the adsorption height, which might be a signature of strongly-anisotropic thermal vibrations of the weakly bonded molecules.
ISSN:2040-3364
2040-3372
DOI:10.1039/c8nr06387g