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Contactless THz-based bulk semiconductor mobility measurements using two-photon excitation

We perform contactless bulk mobility measurements for ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump THz probe experiment. As opposed to above-gap excitation or contact methods, two-photon absorption excites the entire sample thickness producing measurable signals with 10 carriers/cm and higher d...

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Bibliographic Details
Published in:Optics express 2018-11, Vol.26 (23), p.29848-29853
Main Authors: Wahlstrand, J K, Heilweil, E J
Format: Article
Language:English
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Summary:We perform contactless bulk mobility measurements for ZnSe, ZnTe, GaP, CdS, and GaSe in an optical pump THz probe experiment. As opposed to above-gap excitation or contact methods, two-photon absorption excites the entire sample thickness producing measurable signals with 10 carriers/cm and higher density. For ZnTe and GaSe samples, the measured mobility using two-photon excitation is higher than that measured with one-photon excitation.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.26.029848