Erasable and recreatable two-dimensional electron gas at the heterointerface of SrTiO3 and a water-dissolvable overlayer

The erasable and recreatable 2D electron gas at SrTiO 3 -based heterointerface paves the way towards future novel electronics. While benefiting greatly from electronics, our society also faces a major problem of electronic waste, which has already caused environmental pollution and adverse human hea...

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Bibliographic Details
Published in:Science advances 2019-08, Vol.5 (8), p.eaaw7286-eaaw7286
Main Authors: Han, Kun, Hu, Kaige, Li, Xiao, Huang, Ke, Huang, Zhen, Zeng, Shengwei, Qi, Dongchen, Ye, Chen, Yang, Jian, Xu, Huan, Ariando, Ariando, Yi, Jiabao, Lü, Weiming, Yan, Shishen, Wang, X Renshaw
Format: Article
Language:English
Subjects:
Materials Science
Physical Sciences
SciAdv r-articles
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Summary:The erasable and recreatable 2D electron gas at SrTiO 3 -based heterointerface paves the way towards future novel electronics. While benefiting greatly from electronics, our society also faces a major problem of electronic waste, which has already caused environmental pollution and adverse human health effects. Therefore, recyclability becomes a must-have feature in future electronics. Here, we demonstrate an erasable and recreatable two-dimensional electron gas (2DEG), which can be easily created and patterned by depositing a water-dissolvable overlayer of amorphous Sr 3 Al 2 O 6 ( a -SAO) on SrTiO 3 (STO) at room temperature. The 2DEG can be repeatedly erased or recreated by depositing the a -SAO or dissolving in water, respectively. Photoluminescence results show that the 2DEG arises from the a -SAO–induced oxygen vacancy. Furthermore, by gradually depleting the 2DEG, a transition of nonlinear to linear Hall effect is observed, demonstrating an unexpected interfacial band structure. The convenience and repeatability in the creation of the water-dissolvable 2DEG with rich physics could potentially contribute to the exploration of next generation electronics, such as environment-friendly or water-soluble electronics.
ISSN:2375-2548
DOI:10.1126/sciadv.aaw7286