Loading…
Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry
In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid...
Saved in:
Published in: | Scientific reports 2020-06, Vol.10 (1), p.9240-9240, Article 9240 |
---|---|
Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173 |
---|---|
cites | cdi_FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173 |
container_end_page | 9240 |
container_issue | 1 |
container_start_page | 9240 |
container_title | Scientific reports |
container_volume | 10 |
creator | Razzaghi, Ahmad Amjad, Jafar Mostafavi Maleki, Maniya |
description | In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid plates with known thickness and is verified to be accurate. Then we use it for the thickness measurement of liquid films in two experiments. The first experiment is spin coating and the second is dip coating. In both experiments, the results are in agreement with theoretical and experimental results of previous works. In the dip coating experiment, the Landau-Levich-Derjaguin law (LLD) is observed in low capillary numbers, and a deviation from this law due to gravity is seen in higher capillary numbers. The thinning due to the drainage is also observed and is consistent with theoretical predictions. |
doi_str_mv | 10.1038/s41598-020-65799-z |
format | article |
fullrecord | <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_7280532</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2410659218</sourcerecordid><originalsourceid>FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173</originalsourceid><addsrcrecordid>eNp9kUlLBDEQhYMoKuof8NTgxUtrlk535yKIuMGA4nKUUJOuONFexqTb7debcQa3g7kkRb73eMUjZJvRPUZFuR8yJlWZUk7TXBZKpe9LZJ3TTKZccL78471GtkJ4oPFIrjKmVsma4JIJpfg6ubuZOPPYYghJgxAGjw22fdLZpPfQhin42Vi7p8FViXV1E5IX10-SS_Dw6qBOrrG26RVajKDB5Lzt0ceha7D3b5tkxUIdcGtxb5Dbk-Obo7N0dHF6fnQ4Sk0mWZ9CxS3PjVW5ykUJorIW0JQFFkJIxbNKWluIzBoQgpY5GwsQLMstG1dUAivEBjmY-06HcYOViZk91HrqXQP-TXfg9O-f1k30ffesC15SKXg02F0Y-O5pwNDrxgWDdQ0tdkPQPGOM0UJyGdGdP-hDN_g2rjejaB4DszJSfE4Z34Xg0X6FYVTPCtTzAnUsUH8WqN-jSMxFIcLtPfpv639UH9MonzE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2410659218</pqid></control><display><type>article</type><title>Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry</title><source>Publicly Available Content Database</source><source>Full-Text Journals in Chemistry (Open access)</source><source>PubMed Central</source><source>Springer Nature - nature.com Journals - Fully Open Access</source><creator>Razzaghi, Ahmad ; Amjad, Jafar Mostafavi ; Maleki, Maniya</creator><creatorcontrib>Razzaghi, Ahmad ; Amjad, Jafar Mostafavi ; Maleki, Maniya</creatorcontrib><description>In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid plates with known thickness and is verified to be accurate. Then we use it for the thickness measurement of liquid films in two experiments. The first experiment is spin coating and the second is dip coating. In both experiments, the results are in agreement with theoretical and experimental results of previous works. In the dip coating experiment, the Landau-Levich-Derjaguin law (LLD) is observed in low capillary numbers, and a deviation from this law due to gravity is seen in higher capillary numbers. The thinning due to the drainage is also observed and is consistent with theoretical predictions.</description><identifier>ISSN: 2045-2322</identifier><identifier>EISSN: 2045-2322</identifier><identifier>DOI: 10.1038/s41598-020-65799-z</identifier><identifier>PMID: 32513992</identifier><language>eng</language><publisher>London: Nature Publishing Group UK</publisher><subject>639/624 ; 639/766 ; Coatings ; Humanities and Social Sciences ; Interferometry ; multidisciplinary ; Science ; Science (multidisciplinary)</subject><ispartof>Scientific reports, 2020-06, Vol.10 (1), p.9240-9240, Article 9240</ispartof><rights>The Author(s) 2020</rights><rights>The Author(s) 2020. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173</citedby><cites>FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2410659218/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2410659218?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>230,314,727,780,784,885,25753,27924,27925,37012,37013,44590,53791,53793,75126</link.rule.ids></links><search><creatorcontrib>Razzaghi, Ahmad</creatorcontrib><creatorcontrib>Amjad, Jafar Mostafavi</creatorcontrib><creatorcontrib>Maleki, Maniya</creatorcontrib><title>Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry</title><title>Scientific reports</title><addtitle>Sci Rep</addtitle><description>In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid plates with known thickness and is verified to be accurate. Then we use it for the thickness measurement of liquid films in two experiments. The first experiment is spin coating and the second is dip coating. In both experiments, the results are in agreement with theoretical and experimental results of previous works. In the dip coating experiment, the Landau-Levich-Derjaguin law (LLD) is observed in low capillary numbers, and a deviation from this law due to gravity is seen in higher capillary numbers. The thinning due to the drainage is also observed and is consistent with theoretical predictions.</description><subject>639/624</subject><subject>639/766</subject><subject>Coatings</subject><subject>Humanities and Social Sciences</subject><subject>Interferometry</subject><subject>multidisciplinary</subject><subject>Science</subject><subject>Science (multidisciplinary)</subject><issn>2045-2322</issn><issn>2045-2322</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNp9kUlLBDEQhYMoKuof8NTgxUtrlk535yKIuMGA4nKUUJOuONFexqTb7debcQa3g7kkRb73eMUjZJvRPUZFuR8yJlWZUk7TXBZKpe9LZJ3TTKZccL78471GtkJ4oPFIrjKmVsma4JIJpfg6ubuZOPPYYghJgxAGjw22fdLZpPfQhin42Vi7p8FViXV1E5IX10-SS_Dw6qBOrrG26RVajKDB5Lzt0ceha7D3b5tkxUIdcGtxb5Dbk-Obo7N0dHF6fnQ4Sk0mWZ9CxS3PjVW5ykUJorIW0JQFFkJIxbNKWluIzBoQgpY5GwsQLMstG1dUAivEBjmY-06HcYOViZk91HrqXQP-TXfg9O-f1k30ffesC15SKXg02F0Y-O5pwNDrxgWDdQ0tdkPQPGOM0UJyGdGdP-hDN_g2rjejaB4DszJSfE4Z34Xg0X6FYVTPCtTzAnUsUH8WqN-jSMxFIcLtPfpv639UH9MonzE</recordid><startdate>20200608</startdate><enddate>20200608</enddate><creator>Razzaghi, Ahmad</creator><creator>Amjad, Jafar Mostafavi</creator><creator>Maleki, Maniya</creator><general>Nature Publishing Group UK</general><general>Nature Publishing Group</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7X7</scope><scope>7XB</scope><scope>88A</scope><scope>88E</scope><scope>88I</scope><scope>8FE</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M2P</scope><scope>M7P</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>Q9U</scope><scope>7X8</scope><scope>5PM</scope></search><sort><creationdate>20200608</creationdate><title>Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry</title><author>Razzaghi, Ahmad ; Amjad, Jafar Mostafavi ; Maleki, Maniya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>639/624</topic><topic>639/766</topic><topic>Coatings</topic><topic>Humanities and Social Sciences</topic><topic>Interferometry</topic><topic>multidisciplinary</topic><topic>Science</topic><topic>Science (multidisciplinary)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Razzaghi, Ahmad</creatorcontrib><creatorcontrib>Amjad, Jafar Mostafavi</creatorcontrib><creatorcontrib>Maleki, Maniya</creatorcontrib><collection>Springer Open Access</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Biology Database (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Science Database</collection><collection>Biological Science Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central Basic</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Scientific reports</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Razzaghi, Ahmad</au><au>Amjad, Jafar Mostafavi</au><au>Maleki, Maniya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry</atitle><jtitle>Scientific reports</jtitle><stitle>Sci Rep</stitle><date>2020-06-08</date><risdate>2020</risdate><volume>10</volume><issue>1</issue><spage>9240</spage><epage>9240</epage><pages>9240-9240</pages><artnum>9240</artnum><issn>2045-2322</issn><eissn>2045-2322</eissn><abstract>In this paper, we introduce a non-invasive optical method, named Paraxial Self-Reference Interferometry (PSRI) for thickness measurement of liquid films. The method can be used for thin or thick layers (from μm to mm) of solids or liquids, with a high precision. The method is first applied to solid plates with known thickness and is verified to be accurate. Then we use it for the thickness measurement of liquid films in two experiments. The first experiment is spin coating and the second is dip coating. In both experiments, the results are in agreement with theoretical and experimental results of previous works. In the dip coating experiment, the Landau-Levich-Derjaguin law (LLD) is observed in low capillary numbers, and a deviation from this law due to gravity is seen in higher capillary numbers. The thinning due to the drainage is also observed and is consistent with theoretical predictions.</abstract><cop>London</cop><pub>Nature Publishing Group UK</pub><pmid>32513992</pmid><doi>10.1038/s41598-020-65799-z</doi><tpages>1</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 2045-2322 |
ispartof | Scientific reports, 2020-06, Vol.10 (1), p.9240-9240, Article 9240 |
issn | 2045-2322 2045-2322 |
language | eng |
recordid | cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_7280532 |
source | Publicly Available Content Database; Full-Text Journals in Chemistry (Open access); PubMed Central; Springer Nature - nature.com Journals - Fully Open Access |
subjects | 639/624 639/766 Coatings Humanities and Social Sciences Interferometry multidisciplinary Science Science (multidisciplinary) |
title | Thickness measurement of transparent liquid films with Paraxial Self-Reference Interferometry |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T18%3A58%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Thickness%20measurement%20of%20transparent%20liquid%20films%20with%20Paraxial%20Self-Reference%20Interferometry&rft.jtitle=Scientific%20reports&rft.au=Razzaghi,%20Ahmad&rft.date=2020-06-08&rft.volume=10&rft.issue=1&rft.spage=9240&rft.epage=9240&rft.pages=9240-9240&rft.artnum=9240&rft.issn=2045-2322&rft.eissn=2045-2322&rft_id=info:doi/10.1038/s41598-020-65799-z&rft_dat=%3Cproquest_pubme%3E2410659218%3C/proquest_pubme%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c451t-ad2f26cf969638a3dffaec87e7335924d5ff734fca330861b3a3146f1bd05a173%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2410659218&rft_id=info:pmid/32513992&rfr_iscdi=true |