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Modelling phase imperfections in compound refractive lenses
A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X‐ray beam is described, taking into account measured phase errors obtained from at‐wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase...
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Published in: | Journal of synchrotron radiation 2020-03, Vol.27 (2), p.305-318 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Request full text |
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Summary: | A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X‐ray beam is described, taking into account measured phase errors obtained from at‐wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase element, then as a more realistic compound element including absorption and thickness effects, and finally adding realistic optical imperfections to the CRL. Coherent and partially coherent simulations using Synchrotron Radiation Workshop (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.
Coherent and partially coherent accurate wavefront propagation simulations using Synchrotron Radiation Workshop (SRW) through thick two‐dimensional Be compound refractive lenses are presented, taking into account the effects of phase errors obtained by X‐ray speckle vectorial tracking at the BM05 Instrumentation Beamline at the ESRF. |
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ISSN: | 1600-5775 0909-0495 1600-5775 |
DOI: | 10.1107/S1600577519017235 |