Insights into a dual‐phase steel microstructure using EBSD and image‐processing‐based workflow

Quantitative metallography to understand the morphology of different crystallographic phases in a material often rests on the segmentation and classification of electron backscatter diffraction (EBSD) maps. Image analysis offers rich toolboxes to perform such tasks based on `scalar' images. Emb...

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Bibliographic Details
Published in:Journal of applied crystallography 2022-06, Vol.55 (3), p.601-610
Main Authors: Mollens, Maxime, Roux, Stéphane, Hild, François, Guery, Adrien
Format: Article
Language:English
Subjects:
Chemical Sciences
classification
Cristallography
Crystal structure
crystallographic phases
Crystallography
Dual phase steels
duplex stainless steels
Electron backscatter diffraction
electron backscatter diffraction (EBSD)
Image analysis
Image classification
Image processing
Image segmentation
Interpolation
Metallography
microstructures
orientations
Quantitative metallography
Quaternions
Research Papers
segmentation
Stainless steel
Stainless steels
Workflow
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Summary:Quantitative metallography to understand the morphology of different crystallographic phases in a material often rests on the segmentation and classification of electron backscatter diffraction (EBSD) maps. Image analysis offers rich toolboxes to perform such tasks based on `scalar' images. Embracing the entire wealth of information provided by crystallography, operations such as erosion, dilation, interpolation, smoothing and segmentation require generalizations to do justice to the very nature of crystal orientations (e.g. preserving properties like frame indifference). The present study gives such extensions based on quaternion representation of crystal orientations. A dual‐phase stainless steel specimen is used to illustrate the different steps of such a procedure. In this article, an image‐analysis‐based method is applied to electron backscatter diffraction (EBSD) data in order to recover specific properties in a complex microstructure, and some new dedicated tools are developed and compared with existing methods.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576722004265