Route to extreme events in a parametrically driven position-dependent nonlinear oscillator

We explore the dynamics of a damped and driven Mathews–Lakshmanan oscillator type model with position-dependent mass term and report two distinct bifurcation routes to the advent of sudden, intermittent large-amplitude chaotic oscillations in the system. We characterize these infrequent and recurren...

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Bibliographic Details
Published in:European physical journal plus 2023-01, Vol.138 (1), p.36-36, Article 36
Main Authors: Kaviya, B., Gopal, R., Suresh, R., Chandrasekar, V. K.
Format: Article
Language:English
Subjects:
Applied and Technical Physics
Atomic
Bifurcations
Complex Systems
Condensed Matter Physics
Damping
Dynamical systems
Liapunov exponents
Mathematical and Computational Physics
Molecular
Optical and Plasma Physics
Oscillations
Oscillators
Physics
Physics and Astronomy
Regular
Regular Article
Spectrum analysis
Theoretical
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Summary:We explore the dynamics of a damped and driven Mathews–Lakshmanan oscillator type model with position-dependent mass term and report two distinct bifurcation routes to the advent of sudden, intermittent large-amplitude chaotic oscillations in the system. We characterize these infrequent and recurrent large oscillations as extreme events (EE) when they are significantly greater than the pre-defined threshold height. In the first bifurcation route, the system exhibits a bifurcation from quasiperiodic (QP) attractor to chaotic attractor via strange non-chaotic (SNA) attractor as a function of damping parameter. In the second route, the chaotic attractor in the form of EE has emerged directly from the QP attractor. Hence, to the best of our knowledge, this is the first study to report the birth of EE from these two distinct bifurcation routes. We also discuss that EE are emerged due to the sudden expansion of the chaotic attractor via interior crisis in the system. Regions of different dynamical states are distinguished using the Lyapunov exponent spectrum. Further, SNA and QP dynamics are determined using the singular spectrum analysis and 0–1 test. The region of EE is characterized using the threshold height.
ISSN:2190-5444
2190-5444
DOI:10.1140/epjp/s13360-022-03625-3