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Ag-NP@Ge-nanotaper/Si-micropillar ordered arrays as ultrasensitive and uniform surface enhanced Raman scattering substratesElectronic supplementary information (ESI) available. See DOI: 10.1039/c5nr06001j
Surface-enhanced Raman scattering (SERS) is considered to be an excellent candidate for analytical detection schemes, because of its molecular specificity, rapid response and high sensitivity. Here, SERS-substrates of Ag-nanoparticle (Ag-NP) decorated Ge-nanotapers grafted on hexagonally ordered Si-...
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Main Authors: | , , , , |
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Format: | Article |
Language: | English |
Online Access: | Get full text |
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Summary: | Surface-enhanced Raman scattering (SERS) is considered to be an excellent candidate for analytical detection schemes, because of its molecular specificity, rapid response and high sensitivity. Here, SERS-substrates of Ag-nanoparticle (Ag-NP) decorated Ge-nanotapers grafted on hexagonally ordered Si-micropillar (denoted as Ag-NP@Ge-nanotaper/Si-micropillar) arrays are fabricated
via
a combinatorial process of two-step etching to achieve hexagonal Si-micropillar arrays, chemical vapor deposition of flocky Ge-nanotapers on each Si-micropillar and decoration of Ag-NPs onto the Ge-nanotapers through galvanic displacement. With high density three-dimensional (3D) "hot spots" created from the large quantities of the neighboring Ag-NPs and large-scale uniform morphology, the hierarchical Ag-NP@Ge-nanotaper/Si-micropillar arrays exhibit strong and reproducible SERS activity. Using our hierarchical 3D SERS-substrates, both methyl parathion (a commonly used pesticide) and PCB-2 (one congener of highly toxic polychlorinated biphenyls) with concentrations down to 10
−7
M and 10
−5
M have been detected respectively, showing great potential in SERS-based rapid trace-level detection of toxic organic pollutants in the environment.
Large area 3D arrays of Ag nanoparticles decorated Ge-nanotapers grafted on hexagonal Si-micropillars show strong and reproducible SERS sensitivity for toxic organic pollutants. |
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ISSN: | 2040-3364 2040-3372 |
DOI: | 10.1039/c5nr06001j |