Structure, morphology and magnetism of an ultra-thin [NiO/CoO]/PtCo bilayer with perpendicular exchange bias

• Published in: Brazilian journal of physics 2009-04, Vol.39 (1a), p.150-155
• Main Authors: Tolentino, Helio C. N., De Santis, Maurizio, Tonnerre, Jean-Marc, Ramos, Aline Y., Langlais, Veronique, Grenier, Stephane, Bailly, Aude
• Format: Article
• Language: English
• Subjects: Condensed Matter; Materials Science; Physics; PHYSICS, MULTIDISCIPLINARY
• ISSN: 0103-9733; 1678-4448; 0103-9733
• DOI: 10.1590/S0103-97332009000200005

Electronic and magnetic properties of nanoscale materials are closely related to the atomic arrangement at the interface shared by different chemical elements. A very precise knowledge of the surface/interface structure is then essential to properly interpret the new properties coming out. Of a particular interest is the relationship between structure, morphology and magnetic properties of exchanged-coupled interfaces in ferromagnetic (FM) and antiferromagnetic (AF) materials. The interaction at the AF/FM interface modifies the magnetic switching properties of the FM film, which turn out to be a usefull property on new magnetic devices technology. We present here an investigation of the buried exchange-coupled interface [NiO/CoO]/[PtCo] grown on a Pt(111) single crystal. The magneto-optical Kerr effect reveals a strong coupling at the interface, by an increasing coercivity, and a spin reorientation of the FM film when ordering occurs in the AF layer. The combination of grazing incidence X-ray diffraction, X-ray reflectivity and soft X-ray resonant magnetic scattering yields a comprehensive description of the system.