Two opto‐electronic processes for measuring plano‐cylindrical lens curvature radii

This paper describes two opto‐electronic processes useful for measuring curvature radii of optical components. The two methods start from the fact that, within the geometrical optics approximation, a pencil of rays can be marked electronically and thus located during its propagation through the opti...

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Published in:Review of scientific instruments 1987-09, Vol.58 (9), p.1665-1671
Main Authors: Niay, P., Bernage, P., Bocquet, H.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Holography
Optics
Physics
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container_issue 9
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container_title Review of scientific instruments
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creator Niay, P.
Bernage, P.
Bocquet, H.
description This paper describes two opto‐electronic processes useful for measuring curvature radii of optical components. The two methods start from the fact that, within the geometrical optics approximation, a pencil of rays can be marked electronically and thus located during its propagation through the optical system. The two methods have proved to be useful for accurately measuring plano‐cylindrical lens curvature radius.
doi_str_mv 10.1063/1.1139365
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source American Institute of Physics (AIP) Publications; AIP Digital Archive
subjects Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Holography
Optics
Physics
title Two opto‐electronic processes for measuring plano‐cylindrical lens curvature radii
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