Electron‐impact ionization time‐of‐flight mass spectrometer for molecular beams

A method is described for performing electron‐impact ionization time‐of‐flight mass spectrometry in a molecular beam apparatus. It provides a convenient means for optimizing the performance of pulsed or continuous nozzle sources and can be used in conjunction with laser excitation. Mass spectra are...

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Bibliographic Details
Published in:Review of scientific instruments 1987-01, Vol.58 (1), p.32-37
Main Authors: Pollard, J. E., Cohen, R. B.
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Mass spectrometers and related techniques
Physics
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Summary:A method is described for performing electron‐impact ionization time‐of‐flight mass spectrometry in a molecular beam apparatus. It provides a convenient means for optimizing the performance of pulsed or continuous nozzle sources and can be used in conjunction with laser excitation. Mass spectra are produced either as analog waveforms or in a high repetition rate ion counting mode. The device can also be operated as a fast ionization gauge for time‐resolved detection of pulsed beams.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1139562