Profile correction to electron temperature and enhancement factor in soft‐x‐ray pulse‐height‐analysis measurements in tokamaks

Because soft‐x‐ray pulse‐height‐analysis spectra contain chordal information, the electron temperature and the radiation intensity (enhancement factor) measurements do not represent the local values. The correction factors for the electron temperature and the enhancement factor as a function of the...

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Bibliographic Details
Published in:Review of scientific instruments 1988-08, Vol.59 (8), p.1810-1812
Main Authors: Sesnic, S., Diesso, M., Hill, K., Holland, A., Pohl, F.
Format: Article
Language:English
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Summary:Because soft‐x‐ray pulse‐height‐analysis spectra contain chordal information, the electron temperature and the radiation intensity (enhancement factor) measurements do not represent the local values. The correction factors for the electron temperature and the enhancement factor as a function of the temperature and density profile parameters and the energy are obtained. The spectrum distortion due to pulse pileup effects is also evaluated. A set of curves is given from which the distortion of the spectrum can be obtained if the electron temperature, the Be filter thickness, and the electronic parameters of the acquisition system are known.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1140120