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Sampling procedure for measuring Hall coefficients using the van der Pauw method
It is shown that care must be exercised in using digital equipment when making Hall measurements in a van der Pauw setup employing the ASTM standard method. This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities (
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Published in: | Review of scientific instruments 1989-11, Vol.60 (11), p.3482-3484 |
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cites | cdi_FETCH-LOGICAL-c242t-7d2d3dd2adf9c20666953f99e9c6a157d74a494b2e27a55918b09e481e1763f13 |
container_end_page | 3484 |
container_issue | 11 |
container_start_page | 3482 |
container_title | Review of scientific instruments |
container_volume | 60 |
creator | Ndlela, Zolili Bates, Clayton W. |
description | It is shown that care must be exercised in using digital equipment when making Hall measurements in a van der Pauw setup employing the ASTM standard method. This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities ( |
doi_str_mv | 10.1063/1.1140497 |
format | article |
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This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities (<100 cm2/V s) this can lead to an incorrect specification of the carrier type and inconsistent mobility behavior. A simple averaging and sampling procedure is suggested to suppress this type of behavior and is found to be sufficient to obtain reliable and repeatable Hall voltages and coefficients.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1140497</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Determination of fundamental constants ; Exact sciences and technology ; Metrology ; Metrology, measurements and laboratory procedures ; Physics</subject><ispartof>Review of scientific instruments, 1989-11, Vol.60 (11), p.3482-3484</ispartof><rights>American Institute of Physics</rights><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c242t-7d2d3dd2adf9c20666953f99e9c6a157d74a494b2e27a55918b09e481e1763f13</citedby><cites>FETCH-LOGICAL-c242t-7d2d3dd2adf9c20666953f99e9c6a157d74a494b2e27a55918b09e481e1763f13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1140497$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,782,784,795,1559,27924,27925,76383,76390</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19702182$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ndlela, Zolili</creatorcontrib><creatorcontrib>Bates, Clayton W.</creatorcontrib><title>Sampling procedure for measuring Hall coefficients using the van der Pauw method</title><title>Review of scientific instruments</title><description>It is shown that care must be exercised in using digital equipment when making Hall measurements in a van der Pauw setup employing the ASTM standard method. This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities (<100 cm2/V s) this can lead to an incorrect specification of the carrier type and inconsistent mobility behavior. 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This arises because of quantization error when working near the sensitivity limit of the equipment. For materials with small Hall mobilities (<100 cm2/V s) this can lead to an incorrect specification of the carrier type and inconsistent mobility behavior. A simple averaging and sampling procedure is suggested to suppress this type of behavior and is found to be sufficient to obtain reliable and repeatable Hall voltages and coefficients.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.1140497</doi><tpages>3</tpages></addata></record> |
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ispartof | Review of scientific instruments, 1989-11, Vol.60 (11), p.3482-3484 |
issn | 0034-6748 1089-7623 |
language | eng |
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source | AIP - American Institute of Physics; AIP Digital Archive |
subjects | Determination of fundamental constants Exact sciences and technology Metrology Metrology, measurements and laboratory procedures Physics |
title | Sampling procedure for measuring Hall coefficients using the van der Pauw method |
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