High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate

A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate...

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Bibliographic Details
Published in:Review of Scientific Instruments 1989-07, Vol.60 (7), p.2402-2405
Main Authors: Itoh, F., Sakurai, M., Sugawa, T., Suzuki, K., Sakai, N., Ito, M., Mao, O., Shiotani, N., Tanaka, Y., Sakurai, Y., Nanao, S., Kawata, H., Amemiya, Y., Ando, M.
Format: Article
Language:English
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Summary:A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate as a position sensitive detector. The overall momentum resolution is 0.084 a.u. for the incident x‐ray energy of 29.5 keV. High‐resolution Compton profile measurements on Al, a quasicrystal Al‐Li‐Cu, and solid and liquid phase of Li are shown to demonstrate the performance of this spectrometer.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1140730