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High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate

A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate...

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Published in:Review of Scientific Instruments 1989-07, Vol.60 (7), p.2402-2405
Main Authors: Itoh, F., Sakurai, M., Sugawa, T., Suzuki, K., Sakai, N., Ito, M., Mao, O., Shiotani, N., Tanaka, Y., Sakurai, Y., Nanao, S., Kawata, H., Amemiya, Y., Ando, M.
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cited_by cdi_FETCH-LOGICAL-c299t-d0e23c3a9a6c484f2b89df11992acd0292384ba0c3d3b7e161f01d948390aa083
cites cdi_FETCH-LOGICAL-c299t-d0e23c3a9a6c484f2b89df11992acd0292384ba0c3d3b7e161f01d948390aa083
container_end_page 2405
container_issue 7
container_start_page 2402
container_title Review of Scientific Instruments
container_volume 60
creator Itoh, F.
Sakurai, M.
Sugawa, T.
Suzuki, K.
Sakai, N.
Ito, M.
Mao, O.
Shiotani, N.
Tanaka, Y.
Sakurai, Y.
Nanao, S.
Kawata, H.
Amemiya, Y.
Ando, M.
description A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate as a position sensitive detector. The overall momentum resolution is 0.084 a.u. for the incident x‐ray energy of 29.5 keV. High‐resolution Compton profile measurements on Al, a quasicrystal Al‐Li‐Cu, and solid and liquid phase of Li are shown to demonstrate the performance of this spectrometer.
doi_str_mv 10.1063/1.1140730
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language eng
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source AIP Digital Archive; AIP Journals (American Institute of Physics)
title High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate
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