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High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate
A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate...
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Published in: | Review of Scientific Instruments 1989-07, Vol.60 (7), p.2402-2405 |
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Main Authors: | , , , , , , , , , , , , , |
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container_end_page | 2405 |
container_issue | 7 |
container_start_page | 2402 |
container_title | Review of Scientific Instruments |
container_volume | 60 |
creator | Itoh, F. Sakurai, M. Sugawa, T. Suzuki, K. Sakai, N. Ito, M. Mao, O. Shiotani, N. Tanaka, Y. Sakurai, Y. Nanao, S. Kawata, H. Amemiya, Y. Ando, M. |
description | A high‐resolution Compton spectrometer has been installed for 29.5‐keV incident x rays from a vertical wiggler inserted in the 2.5‐GeV storage ring of the Photon Factory at Tsukuba. This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate as a position sensitive detector. The overall momentum resolution is 0.084 a.u. for the incident x‐ray energy of 29.5 keV. High‐resolution Compton profile measurements on Al, a quasicrystal Al‐Li‐Cu, and solid and liquid phase of Li are shown to demonstrate the performance of this spectrometer. |
doi_str_mv | 10.1063/1.1140730 |
format | article |
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This spectrometer consists of bent‐crystal monochromator, a Cauchois‐type bent‐crystal analyzer, and an imaging plate as a position sensitive detector. The overall momentum resolution is 0.084 a.u. for the incident x‐ray energy of 29.5 keV. High‐resolution Compton profile measurements on Al, a quasicrystal Al‐Li‐Cu, and solid and liquid phase of Li are shown to demonstrate the performance of this spectrometer.</abstract><doi>10.1063/1.1140730</doi><tpages>4</tpages></addata></record> |
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language | eng |
recordid | cdi_scitation_primary_10_1063_1_1140730 |
source | AIP Digital Archive; AIP Journals (American Institute of Physics) |
title | High‐resolution Compton profile spectrometer for 29.5‐keV x rays with a combination of crystal analyzer and imaging plate |
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