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A new method to do time‐resolved, x‐ray diffraction studies: The rotating crystal Laue method
In order to achieve the ultimate time resolution of a synchrotron source we propose a new experimental technique by which time‐dependent structural changes can be monitored on the time scale of synchrotron pulse widths. Samples will be studied by a rotating crystal Laue diffraction technique where w...
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Published in: | Review of Scientific Instruments 1992-01, Vol.63 (1), p.1032-1034 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In order to achieve the ultimate time resolution of a synchrotron source we propose a new experimental technique by which time‐dependent structural changes can be monitored on the time scale of synchrotron pulse widths. Samples will be studied by a rotating crystal Laue diffraction technique where we rapidly spin the sample and observe the diffraction pattern from a broadband of incident x rays. A computer simulation is presented of the diffraction pattern time evolution using the parameters for an APS undulator of a phase change in the YBa2Cu3O7−x
superconductor. We will discuss the application of this and closely related techniques at other synchrotron sources including bending magnets and insertion devices at NSLS and CHESS. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1143191 |