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A new method to do time‐resolved, x‐ray diffraction studies: The rotating crystal Laue method

In order to achieve the ultimate time resolution of a synchrotron source we propose a new experimental technique by which time‐dependent structural changes can be monitored on the time scale of synchrotron pulse widths. Samples will be studied by a rotating crystal Laue diffraction technique where w...

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Bibliographic Details
Published in:Review of Scientific Instruments 1992-01, Vol.63 (1), p.1032-1034
Main Authors: Knapp, G. S., Beno, M. A.
Format: Article
Language:English
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Summary:In order to achieve the ultimate time resolution of a synchrotron source we propose a new experimental technique by which time‐dependent structural changes can be monitored on the time scale of synchrotron pulse widths. Samples will be studied by a rotating crystal Laue diffraction technique where we rapidly spin the sample and observe the diffraction pattern from a broadband of incident x rays. A computer simulation is presented of the diffraction pattern time evolution using the parameters for an APS undulator of a phase change in the YBa2Cu3O7−x superconductor. We will discuss the application of this and closely related techniques at other synchrotron sources including bending magnets and insertion devices at NSLS and CHESS.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1143191