Dark‐field imaging with the scanning transmission x‐ray microscope

The King’s College London scanning transmission x‐ray microscope in use on beam line 5U2 at the SRS, SERC Daresbury Laboratory, has been modified to allow dark‐field images to be formed using only the x rays scattered by the specimen. Experiments have been performed with a number of different detect...

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Bibliographic Details
Published in:Review of Scientific Instruments 1992-01, Vol.63 (1), p.611-614
Main Authors: Morrison, G. R., Browne, M. T.
Format: Article
Language:English
Subjects:
430303 - Particle Accelerators- Experimental Facilities & Equipment
440600 - Optical Instrumentation- (1990-)
Electromagnetism
electron and ion optics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
MEASURING INSTRUMENTS
MICROSCOPES
OTHER INSTRUMENTATION
PARTICLE ACCELERATORS
Physics
Radiation by moving charges
RADIATION DETECTORS
RADIATION SOURCES
RESOLUTION
SYNCHROTRON RADIATION SOURCES
X-RAY EQUIPMENT
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Summary:The King’s College London scanning transmission x‐ray microscope in use on beam line 5U2 at the SRS, SERC Daresbury Laboratory, has been modified to allow dark‐field images to be formed using only the x rays scattered by the specimen. Experiments have been performed with a number of different detector geometries, and this has confirmed that the strongest scattering arises from edges or thickness gradients in the specimen. Although the dark‐field signal is only a small fraction of the normal transmitted bright‐field signal, features can be revealed with high contrast, and it has proved possible to detect the presence of features that are below the resolution limit of the microscope.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1143820