Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes

We have calibrated the displacement/voltage (Å/V) response of our piezoelectric scanning tube (PZT‐5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (Å/V) response as a function of voltage up to 220 V at room temperature, imaging a gold‐plated diffracti...

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Bibliographic Details
Published in:Review of scientific instruments 1993-04, Vol.64 (4), p.896-899
Main Authors: Vandervoort, K. G., Zasadzinski, R. K., Galicia, G. G., Crabtree, G. W.
Format: Article
Language:English
Subjects:
440101 - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments
ANL
CALIBRATION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
Exact sciences and technology
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
MICROSCOPES
MICROSCOPY
NATIONAL ORGANIZATIONS
Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
SCANNING ELECTRON MICROSCOPY
TEMPERATURE RANGE
TEMPERATURE RANGE 0000-0013 K
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TUNNEL EFFECT
US AEC
US DOE
US ERDA
US ORGANIZATIONS
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Summary:We have calibrated the displacement/voltage (Å/V) response of our piezoelectric scanning tube (PZT‐5A) by imaging graphite at over 40 temperatures between 4 and 300 K. We have also calibrated the (Å/V) response as a function of voltage up to 220 V at room temperature, imaging a gold‐plated diffraction grating. We find that the temperature dependence of the (Å/V) response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the (Å/V) response makes the PZT‐5A lead zirconate titanate composition a convenient choice for low temperature scanning tunneling microscope piezo tube elements.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1144139